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NSVMMUN2217L PDF预览

NSVMMUN2217L

更新时间: 2024-02-05 13:35:17
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安森美 - ONSEMI /
页数 文件大小 规格书
5页 63K
描述
Digital Transistors (BRT)

NSVMMUN2217L 数据手册

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MMUN2217L,  
NSVMMUN2217L  
Digital Transistors (BRT)  
R1 = 4.7 kW, R2 = 10 kW  
NPN Transistors with Monolithic Bias  
Resistor Network  
www.onsemi.com  
PIN CONNECTIONS  
This series of digital transistors is designed to replace a single  
device and its external resistor bias network. The Bias Resistor  
Transistor (BRT) contains a single transistor with a monolithic bias  
network consisting of two resistors; a series base resistor and a  
base−emitter resistor. The BRT eliminates these individual  
components by integrating them into a single device. The use of a BRT  
can reduce both system cost and board space.  
PIN 3  
COLLECTOR  
(OUTPUT)  
PIN 1  
BASE  
(INPUT)  
R1  
R2  
PIN 2  
EMITTER  
(GROUND)  
Features  
Simplifies Circuit Design  
Reduces Board Space  
Reduces Component Count  
NSV Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC−Q101  
Qualified and PPAP Capable  
MARKING DIAGRAM  
SOT−23  
CASE 318  
STYLE 6  
AAM MG  
G
1
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS  
Compliant  
AAM  
M
Specific Device Code  
=
Date Code*  
G
=
Pb−Free Package  
MAXIMUM RATINGS (T = 25°C)  
A
(Note: Microdot may be in either location)  
Rating  
Collector−Base Voltage  
Collector−Emitter Voltage  
Collector Current − Continuous  
Input Forward Voltage  
Symbol  
Max  
50  
Unit  
Vdc  
*Date Code orientation may vary depending up-  
on manufacturing location.  
V
CBO  
CEO  
V
50  
Vdc  
ORDERING INFORMATION  
See detailed ordering, marking, and shipping information in  
the package dimensions section on page 2 of this data sheet.  
I
C
100  
20  
mAdc  
Vdc  
V
IN(fwd)  
Input Reverse Voltage  
V
IN(rev)  
7
Vdc  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
October, 2016 − Rev. 3  
DTC143X/D  

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