DATA SHEET
www.onsemi.com
MOSFET - Power,
FET
V
R
MAX
I MAX
D
(BR)DSS
DS(ON)
N-Channel, PowerTrench[
Power Clip, Symmetric Dual
30 V
4.3 mW @ 10 V
5.4 mW @ 4.5 V
3.5 mW @ 10 V
4.5 mW @ 4.5 V
Q1
30 V
54 A
54 A
Q2
30 V
NTTFD4D1N03P1E
Features
• Latest 30 V MOSFET Technology with Optimized Figure−of−Merit
ELECTRICAL CONNECTION
• Less Junction Capacitance for High Switching Frequency Application
• Lower Q /Q for Shoot−Through Preventing
GD GS
• Small Footprint (3.3mm x 3.3mm) for Compact Design
• These Devices are Pb−Free and are RoHS Compliant
Typical Applications
• DC−DC Converters
• System Voltage Rails
MARKING
DIAGRAM
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Parameter
Drain−to−Source Voltage
Gate−to−Source Voltage
Symbol
Q1
Q2
Unit
V
V
DSS
30
30
3EUN
AYWW
V
GS
+16
−12
+16
−12
V
PIN1
WQFN12
3.3X3.3, 0.65P
CASE 510CJ
Continuous Drain
Current R
I
54
38
20
54
38
20
A
T
T
= 25°C
= 85°C
D
C
q
JC
Steady
State
(Note 3)
C
3EUN = Specific Device Code
Power Dissipation
P
W
A
D
D
D
T
C
= 25°C
A
Y
WW
= Assembly Location
= Year
R
(Note 3)
q
JC
Continuous Drain
Current R
I
D
15
11
15
11
T = 25°C
A
= Work Week
q
JA
Steady T = 85°C
State
(Notes 1, 3)
A
Power Dissipation
P
I
1.7
1.7
W
A
T = 25°C
A
ORDERING INFORMATION
R
(Notes 1, 3)
q
JA
†
Continuous Drain
Current R
12
8
12
8
T = 25°C
A
Device
NTTFD4D1N03P1E
Package
Shipping
D
q
JA
WQFN12
(Pb−Free)
3000 / Tape &
Reel
Steady T = 85°C
State
(Notes 2, 3)
A
Power Dissipation
P
1.0
1.0
W
T = 25°C
A
R
(Notes 2, 3)
q
JA
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Pulsed Drain Current T = 25°C, t = 10 ms
I
DM
408
74
408
74
A
A
p
Single Pulse Drain−to−Source Avalanche
E
AS
mJ
Energy
Q1: I = 7 A , L = 3 mH (Note 4)
L
pk
Q2: I = 7 A , L = 3 mH (Note 4)
L
pk
Operating Junction and Storage Temperature T , T
−55 to + 150
°C
°C
J
stg
Lead Temperature for Soldering
T
L
260
Purposes (1/8″ from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
2
1. Surface−mounted on FR4 board using a 1 in pad size, 2 oz. Cu pad.
2. Surface−mounted on FR4 board using minimum pad size, 2 oz. Cu pad.
3. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
Actual continuous current will be limited by thermal & electro−mechanical
application board design. R
is determined by the user’s board design.
q
JC
4. Q1 100% UIS tested at L = 3 mH, IAS = 7 A.
Q2 100% UIS tested at L = 3 mH, IAS = 7 A.
5. This device is Class 1B ESD HBM Rating.
© Semiconductor Components Industries, LLC, 2020
1
Publication Order Number:
November, 2021 − Rev. 0
NTTFD4D1N03P1E/D