DATA SHEET
www.onsemi.com
MOSFET - Power,
N-Channel, PowerTrench[
Power Clip, Symmetric Dual
30 V
FET
V
R
MAX
I MAX
D
(BR)DSS
DS(ON)
2.5 mW @ 10 V
3.0 mW @ 4.5 V
2.5 mW @ 10 V
3.0 mW @ 4.5 V
Q1
30 V
80 A
80 A
Q2
30 V
NTTFD2D8N03P1E
Features
• Small Footprint (3.3mm x 3.3mm) for Compact Design
ELECTRICAL CONNECTION
• Low R
to Minimize Conduction Losses
• Low Q and Capacitance to Minimize Driver Losses
DS(on)
G
• These Devices are Pb−Free and are RoHS Compliant
Typical Applications
• DC−DC Converters
• System Voltage Rails
MARKING
DIAGRAM
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Parameter
Drain−to−Source Voltage
Gate−to−Source Voltage
Symbol
Q1
Q2
Unit
V
V
DSS
30
30
3ESN
AYWWZZ
V
GS
+16
−12
+16
−12
V
PIN1
WQFN12
3.3X3.3, 0.65P
CASE 510CJ
Continuous Drain
Current R
I
80
58
26
80
58
26
A
T
T
= 25°C
= 85°C
D
C
q
JC
Steady
(Note 3)
C
State
3ESN = Specific Device Code
Power Dissipation
P
W
A
D
D
D
A
Y
= Assembly Location
= Year
T = 25°C
A
R
(Note 3)
q
JC
WW
ZZ
= Work Week
= Assembly Lot Code
Continuous Drain
Current R
I
D
21.1 21.1
15.2 15.2
1.79 1.79
T = 25°C
A
q
JA
T = 85°C
A
Steady
State
(Notes 1, 3)
Power Dissipation
P
I
W
A
T = 25°C
A
R
(Notes 1, 3)
q
JA
ORDERING INFORMATION
Continuous Drain
Current R
16.1 16.1
11.6 11.6
1.04 1.04
T = 25°C
A
D
†
Device
NTTFD2D8N03P1E
Package
Shipping
q
JA
T = 85°C
A
Steady
State
(Notes 2, 3)
WQFN12
(Pb−Free)
3000 / Tape &
Reel
Power Dissipation
P
W
T = 25°C
A
R
(Notes 2, 3)
q
JA
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Pulsed Drain Current T = 25°C, t = 10 ms
I
DM
327
356
A
A
p
Single Pulse Drain−to−Source Avalanche
E
AS
55.4 58.8
mJ
Energy
Q1: I = 33.3 A , L = 0.1 mH (Note 4)
L
pk
Q2: I = 34.3 A , L = 0.1 mH (Note 4)
L
pk
Operating Junction and Storage Temperature T , T
−55 to + 150
°C
°C
J
stg
Lead Temperature for Soldering
T
L
260
Purposes (1/8″ from case for 10 s)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
2
1. Surface−mounted on FR4 board using a 1 in pad size, 2 oz. Cu pad.
2. Surface−mounted on FR4 board using minimum pad size, 2 oz. Cu pad.
3. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
Actual continuous current will be limited by thermal & electro−mechanical
application board design. R
is determined by the user’s board design.
q
JC
4. Q1 100% UIS tested at L = 0.1 mH, IAS = 21.1 A.
Q2 100% UIS tested at L = 0.1 mH, IAS = 21.1 A.
5. This device is Class 1B ESD HBM Rating.
© Semiconductor Components Industries, LLC, 2018
1
Publication Order Number:
June, 2022 − Rev. 4
NTTFD2D8N03P1E/D