ADVANCEINFORMATION
HiPerFETTM
VDSS
ID25
RDS(on)
trr
Power MOSFET
IXFN 43N60 600V 43A
IXFN 40N60 600V 40A
IXFK 43N60 600V 43A
IXFK 40N60 600V 40A
0.13W 200ns
0.15W 200ns
0.13W 200ns
0.15W 200ns
Single MOSFET Die
TO-264 AA (IXFK)
Symbol
VDSS
TestConditions
MaximumRatings
IXFK IXFK IXFN
IXFN
43N60 40N60
43N60 40N60
TJ = 25°C to 150°C
TJ = 25°C to 150°C
600
600
600
600
V
V
G
D (TAB)
VDGR
D
S
VGS
Continuous
Transient
±20
±30
±20
±30
V
V
miniBLOC, SOT-227 B (IXFN)
VGSM
ID25
E153432
S
TC = 25°C
TC = 25°C
TC = 25°C
43
172
43
40
160
40
43
172
43
40
160
40
A
A
A
G
IDM
IAR
EAR
TC = 25°C
60
5
60
5
mJ
S
dv/dt
IS £ IDM, di/dt £ 100 A/ms, VDD £ VDSS
TJ £ 150°C, RG = 2 W
V/ns
D
G = Gate
S = Source
D = Drain
TAB = Drain
PD
TC = 25°C
560
600
W
Either Source terminal at miniBLOC can be used
as Main or Kelvin Source
TJ
TJM
Tstg
-55 ... +150
150
-55 ... +150
°C
°C
°C
Features
· Internationalstandardpackages
· Encapsulating epoxy meets
UL94V-0,flammabilityclassification
· miniBLOC withAluminiumnitride
isolation
TL
1.6 mm (0.063 in) from case for 10 s
300
N/A
°C
VISOL
50/60 Hz, RMS
IISOL £ 1 mA
t = 1 min
t = 1 s
N/A
N/A
2500
3000
V~
V~
Md
Mountingtorque
Terminalconnectiontorque
0.9/6
N/A
1.5/13 Nm/lb.in.
1.5/13 Nm/lb.in.
· Low RDS (on) HDMOSTM process
· Rugged polysilicon gate cell structure
· Unclamped Inductive Switching (UIS)
rated
Weight
10
30
g
· Low package inductance
· Fast intrinsic Rectifier
Applications
Symbol
TestConditions
CharacteristicValues
Min. Max.
· DC-DC converters
· Synchronousrectification
· Battery chargers
· Switched-modeandresonant-mode
powersupplies
· DC choppers
· Temperatureandlightingcontrols
· Low voltage relays
(TJ = 25°C, unless otherwise specified)
VDSS
VGH(th)
VGS= 0 V, ID = 3mA
VDS = VGS, ID = 8mA
600
2
V
V
4
IGSS
IDSS
VGS= ±20 VGE = 0
±200
nA
VDS= 0.8 • VDSS
VGS= 0 V
V
TJ = 25 °C
TJ = 125 °C
400
2
mA
mA
Advantages
RDS(on) VGS= 10 V, ID = 0.5 • ID25
Pulse test, t £ 300 ms,
43N60
40N60
0.13
0.15
W
W
· Easy to mount
· Space savings
· High power density
duty cycle d £ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
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