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RN2108MFV(TPL3) PDF预览

RN2108MFV(TPL3)

更新时间: 2024-11-14 15:49:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
6页 346K
描述
Digital Transistors 100mA -50volts 3Pin 22K x 47Kohms

RN2108MFV(TPL3) 技术参数

生命周期:ActiveReach Compliance Code:unknown
Factory Lead Time:12 weeks风险等级:5.71
Base Number Matches:1

RN2108MFV(TPL3) 数据手册

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RN2107RN2109  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN2107, RN2108, RN2109  
Switching, Inverter Circuit, Interface Circuit  
Unit: mm  
and Driver Circuit Applications  
z Built-in bias resistors  
z Simplified circuit design  
z Fewer parts and simplified manufacturing process  
z Complementary to RN1107 to RN1109  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN2107  
RN2108  
RN2109  
10  
22  
47  
47  
47  
22  
JEDEC  
JEITA  
TOSHIBA  
2-2H1A  
Weight: 2.4 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN2107 to 2109  
Collector-emitter voltage  
RN2107  
RN2108  
RN2109  
6  
Emitter-base voltage  
V
V
7  
EBO  
15  
Collector current  
I
100  
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C*  
RN2107 to 2109  
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*:  
Total rating  
Start of commercial production  
1990-12  
1
2014-03-01  

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