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RN2110F(TE85L) PDF预览

RN2110F(TE85L)

更新时间: 2024-11-11 15:49:47
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
5页 268K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),SOT-416

RN2110F(TE85L) 技术参数

是否Rohs认证:不符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.88Is Samacsys:N
最大集电极电流 (IC):0.1 A最小直流电流增益 (hFE):120
元件数量:1极性/信道类型:PNP
最大功率耗散 (Abs):0.1 W子类别:BIP General Purpose Small Signal
表面贴装:YES晶体管元件材料:SILICON
Base Number Matches:1

RN2110F(TE85L) 数据手册

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RN2110F,RN2111F  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT Process)  
RN2110F,RN2111F  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit : mm  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN1110F, RN1111F  
Equivalent Circuit  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
JEDEC  
JEITA  
V
50  
50  
V
V
CBO  
22HA1A  
TOSHIBA  
Collector-emitter voltage  
Emitter-base voltage  
V
V
CEO  
Weight : 2.3mg (typ.)  
5  
V
EBO  
Collector current  
I
100  
100  
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
T
150  
j
T
stg  
55~150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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