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RN1108FS(TPL3) PDF预览

RN1108FS(TPL3)

更新时间: 2024-11-21 19:54:15
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 129K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,20V V(BR)CEO,50MA I(C),SMT

RN1108FS(TPL3) 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:,Reach Compliance Code:unknown
风险等级:5.84最大集电极电流 (IC):0.05 A
最小直流电流增益 (hFE):120元件数量:1
极性/信道类型:NPN最大功率耗散 (Abs):0.05 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1108FS(TPL3) 数据手册

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RN1107FS~RN1109FS  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1107FS,RN1108FS,RN1109FS  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN2107FS~RN2109FS  
1
3
2
0.8±0.05  
1.0±0.05  
Equivalent Circuit and Bias Resistor Values  
0.1±0.05  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
RN1107FS  
RN1108FS  
RN1109FS  
10  
22  
47  
47  
47  
22  
R1  
0.1±0.05  
B
1.BASE  
2.EMITTER  
E
fSM  
3.COLLECOTR  
JEDEC  
JEITA  
TOSHIBA  
2-1E1A  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2  
common)  
Weight: 0.0006 g (typ.)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
20  
V
V
CBO  
CEO  
RN1107FS~  
RN1109FS  
Collector-emitter voltage  
20  
RN1107FS  
RN1108FS  
RN1109FS  
6
7
Emitter-base voltage  
V
V
EBO  
15  
Collector current  
I
50  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
50  
C
RN1107FS~  
RN1109FS  
T
150  
55~150  
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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