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RN1107_07 PDF预览

RN1107_07

更新时间: 2024-02-01 15:05:58
品牌 Logo 应用领域
东芝 - TOSHIBA 开关驱动
页数 文件大小 规格书
6页 336K
描述
Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications

RN1107_07 数据手册

 浏览型号RN1107_07的Datasheet PDF文件第2页浏览型号RN1107_07的Datasheet PDF文件第3页浏览型号RN1107_07的Datasheet PDF文件第4页浏览型号RN1107_07的Datasheet PDF文件第5页浏览型号RN1107_07的Datasheet PDF文件第6页 
RN1107~1109  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1107, RN1108, RN1109  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z With built-in bias resistors.  
z Simplified circuit design  
z Reduced number of parts and simplified manufacturing process  
z Complementary to RN2107~2109  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1107  
RN1108  
RN1109  
10  
22  
47  
47  
47  
22  
JEDEC  
EIAJ  
TOSHIBA  
Weight: 2.4mg  
2-2H1A  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
RN1107~1109  
RN1107~1109  
RN1107  
V
V
50  
50  
V
V
CBO  
CEO  
Collector-emitter voltage  
6
Emitter-base voltage  
V
V
RN1108  
7
EBO  
RN1109  
15  
Collector current  
RN1107~1109  
RN1107~1109  
RN1107~1109  
RN1107~1109  
I
100  
100  
150  
55~150  
mA  
mW  
°C  
c
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
c
T
j
T
°C  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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