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RN1106FS(TPL3) PDF预览

RN1106FS(TPL3)

更新时间: 2024-11-02 15:49:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
8页 126K
描述
Digital Transistors 50mA 20volts 3Pin 4.7K x 47Kohms

RN1106FS(TPL3) 技术参数

是否Rohs认证:符合生命周期:Active
Reach Compliance Code:unknown风险等级:5.71
Is Samacsys:NBase Number Matches:1

RN1106FS(TPL3) 数据手册

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RN1101FS~RN1106FS  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1101FS,RN1102FS,RN1103FS  
RN1104FS,RN1105FS,RN1106FS  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
1
3
Complementary to RN2101FS~RN2106FS  
2
0.8±0.05  
1.0±0.05  
0.1±0.05  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
0.1±0.05  
RN1101FS  
RN1102FS  
RN1103FS  
RN1104FS  
RN1105FS  
RN1106FS  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
R1  
B
1.BASE  
22  
2.EMITTER  
fSM  
3.COLLECOTR  
47  
E
2.2  
4.7  
JEDEC  
JEITA  
TOSHIBA  
2-1E1A  
Weight: 0.0006g (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
V
V
20  
20  
V
V
CBO  
CEO  
RN1101FS~1106FS  
Collector-emitter voltage  
Emitter-base voltage  
RN1101FS~1104FS  
RN1105FS, 1106FS  
10  
V
V
EBO  
5
Collector current  
I
50  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
50  
C
RN1101FS~RN1106FS  
T
150  
55~150  
j
T
stg  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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