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IRHNA67260PBF

更新时间: 2024-11-05 13:08:51
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英飞凌 - INFINEON 晶体晶体管功率场效应晶体管开关脉冲
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8页 141K
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IRHNA67260PBF 数据手册

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PD-94342D  
RADIATION HARDENED  
POWER MOSFET  
SURFACE-MOUNT (SMD-2)  
IRHNA67260  
200V, N-CHANNEL  
TECHNOLOGY  
Product Summary  
Part Number Radiation Level RDS(on)  
ID  
IRHNA67260 100K Rads (Si) 0.02856A∗  
IRHNA63260 300K Rads (Si) 0.02856A∗  
SMD-2  
International Rectifier’s R6TM technology provides  
superior power MOSFETs for space applications.  
These devices have improved immunity to Single  
Event Effect (SEE) and have been characterized for  
useful performance with Linear Energy Transfer  
(LET) up to 90MeV/(mg/cm2).  
Features:  
n
n
n
n
n
n
n
n
n
n
Low RDS(on)  
Fast Switching  
Single Event Effect (SEE) Hardened  
Low Total Gate Charge  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Surface Mount  
Their combination of very low R  
and faster  
DS(on)  
switching times reduces power loss and increases  
power density in today’s high speed switching  
applications such as DC-DC converters and motor  
controllers. These devices retain all of the well  
established advantages of MOSFETs such as voltage  
control, ease of paralleling and temperature stability  
of electrical parameters.  
Ceramic Package  
Light Weight  
Pre-Irradiation  
Absolute Maximum Ratings  
Parameter  
= 12V, T = 25°C Continuous Drain Current  
Units  
I
D
@ V  
56∗  
GS  
C
A
I
@ V  
= 12V, T = 100°C Continuous Drain Current  
40  
224  
D
GS  
C
I
Pulsed Drain Current À  
Max. Power Dissipation  
Linear Derating Factor  
DM  
@ T = 25°C  
P
250  
W
W/°C  
V
D
C
2.0  
V
Gate-to-Source Voltage  
Single Pulse Avalanche Energy Á  
Avalanche Current À  
±20  
GS  
E
268  
56∗  
mJ  
A
AS  
I
AR  
E
Repetitive Avalanche Energy À  
Peak Diode Recovery dv/dt   
Operating Junction  
25  
mJ  
V/ns  
AR  
dv/dt  
5.0  
T
-55 to 150  
J
oC  
g
T
Storage Temperature Range  
STG  
Pckg. Mounting Surface Temp.  
Weight  
300 (for 5s)  
3.3 (Typical)  
Current is limited by Package  
For footnotes refer to the last page  
www.irf.com  
1
02/16/06  

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