93788A
PD -
RADIATION HARDENED
POWER MOSFET
THRU-HOLE (TO-39)
IRHF57230
200V, N-CHANNEL
TECHNOLOGY
R
5
Product Summary
Part Number Radiation Level RDS(on)
ID
IRHF57230
IRHF53230
IRHF54230
IRHF58230
100K Rads (Si)
300K Rads (Si)
600K Rads (Si)
0.22Ω
0.22Ω
0.22Ω
7.3A
7.3A
7.3A
1000K Rads (Si) 0.275Ω 7.3A
TO-39
International Rectifier’s R5TM technology provides
high performance power MOSFETs for space appli-
cations. These devices have been characterized for
Single Event Effects (SEE) with useful performance
up to an LET of 80 (MeV/(mg/cm2)). The combination
of low RDS(on) and low gate charge reduces the power
losses in switching applications such as DC to DC
converters and motor control. These devices retain
all of the well established advantages of MOSFETs
such as voltage control, fast switching, ease of paral-
leling and temperature stability of electrical param-
eters.
Features:
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Ultra Low RDS(on)
Neutron Tolerant
Identical Pre- and Post-Electrical Test Conditions
Repetitive Avalanche Ratings
Dynamic dv/dt Ratings
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Absolute Maximum Ratings
Pre-Irradiation
Parameter
Units
I
@ V
@ V
= 12V, T = 25°C
Continuous Drain Current
7.3
D
GS
C
A
I
= 12V, T = 100°C Continuous Drain Current
4.5
29
D
GS
C
I
Pulsed Drain Current ➀
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
DM
@ T = 25°C
P
25
W
W/°C
V
D
C
0.2
V
±20
GS
E
Single Pulse Avalanche Energy ➀
Avalanche Current ➀
110
mJ
A
AS
I
7.3
AR
E
Repetitive Avalanche Energy ➀
Peak Diode Recovery dv/dt ➀
Operating Junction
2.5
mJ
V/ns
AR
dv/dt
7.0
T
-55 to 150
J
T
Storage Temperature Range
oC
g
STG
Lead Temperature
Weight
300 (0.063 in./1.6mm from case for 10s)
0.98 (Typical)
For footnotes refer to the last page
www.irf.com
1
07/15/02