Datasheet > TPCP8507(TE85L,F)

TPCP8507(TE85L,F)

更新时间： 2024-02-06 02:21:26

品牌	Logo	应用领域
东芝 - TOSHIBA		/
页数	文件大小	规格书
5页	171K
描述
TRANSISTOR,BJT,NPN,120V V(BR)CEO,1A I(C),TSOP

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TPCP8507(TE85L,F) 技术参数

是否Rohs认证：	符合	生命周期：	Active
包装说明：	,	Reach Compliance Code：	unknown
风险等级：	5.61	最大集电极电流 (IC)：	1 A
配置：	Single	最小直流电流增益 (hFE)：	120
最高工作温度：	150 °C	极性/信道类型：	NPN
最大功率耗散 (Abs)：	3 W	子类别：	Other Transistors
表面贴装：	YES	Base Number Matches：	1

TPCP8507(TE85L,F) 数据手册

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TPCP8507

TOSHIBA Transistor Silicon NPN Epitaxial Type

TPCP8507

High-Speed Switching Applications

Unit: mm

DC/DC Converters

0.33±0.05

0.05

•

High DC current gain: h_FE= 120~300 (IC = 0.1 A)

Low collector-emitter saturation voltage: V_CE(sat)= 0.14 V (max)

High-speed switching: t_f= 0.2 μs (typ.)

0.475

0.05

0.65

2.9±0.1

Absolute Maximum Ratings (Ta = 25°C)

0.8±0.05

Characteristic

Collector-base voltage

Symbol

Rating

Unit

0.025

+0.1

0.28

0.17±0.02

-0.11

180

150

CBO

Collector-emitter voltage

CEX

+0.13

-0.12

1.12

120

CEO

+0.13

-0.12

EBO

DC (Note 1)

1.0

+0.1

0.28

Collector current

-0.11

Pulsed (Note 1)

2.0

1. Collector 5. Emitter

2. Collector 6. Collector

3. Collector 7. Collector

Base current

0.1

t = 10 s

3.00

1.25

150

°C

Collector power

dissipation

(Note 2)

4. Base

8. Collector

Junction temperature

JEDEC

⎯

Storage temperature range

−55~150

stg

JEITA

Note 1: Ensure that the channel temperature does not exceed 150°C

during use of the device.

TOSHIBA

2-3V1A

Weight: 0.017 g (typ.)

Note 2: Mounted on an FR4 board (glass epoxy; 1.6 mm thick; Cu area,

645 mm²)

Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly

even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute

maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

2006-11-13

12 3 4 5

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