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TPCP8603 PDF预览

TPCP8603

更新时间: 2024-01-10 17:29:45
品牌 Logo 应用领域
东芝 - TOSHIBA 转换器开关
页数 文件大小 规格书
5页 209K
描述
High-Speed Switching Applications DC/DC Converters Strobe Applications

TPCP8603 数据手册

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TPCP8603  
TOSHIBA Transistor Silicon PNP Epitaxial Type  
TPCP8603  
High-Speed Switching Applications  
Unit: mm  
DC/DC Converters  
Strobe Applications  
0.33±0.05  
A
M
0.05  
5
8
High DC current gain: hFE = 120300 (IC = −0.1 A)  
Low collector-emitter saturation voltage: VCE (sat) = −0.2 V (max)  
High-speed switching: tf = 120 ns (typ.)  
0.475  
1
4
B
B
M
0.05  
0.65  
2.9±0.1  
A
0.8±0.05  
Absolute Maximum Ratings (Ta = 25°C)  
S
0.025  
+0.1  
-0.11  
S
0.28  
0.17±0.02  
Characteristic  
Collector-vase voltage  
Symbol  
Rating  
Unit  
V
120  
120  
7  
V
V
+0.13  
-0.12  
CBO  
1.12  
1.12  
Collector-emitter voltage  
Collector-emitter voltage  
V
CEO  
EBO  
+0.13  
-0.12  
V
V
+0.1  
DC (Note 1)  
I
1.0  
2.0  
0.1  
A
0.28  
C
-0.11  
Collector current  
Pulsed (Note 1)  
I
A
CP  
1. Collector 5. Emitter  
2. Collector 6. Collector  
3. Collector 7. Collector  
Base current  
I
A
B
t = 10 s  
DC  
3.00  
1.25  
150  
W
W
°C  
°C  
Collector power  
dissipation  
P
(Note 2)  
C
4. Base  
8. Collector  
Junction temperature  
T
j
JEDEC  
Storage temperature range  
T
55~150  
stg  
JEITA  
Note 1: Ensure that the channel temperature does not exceed 150°C  
during use of the device.  
TOSHIBA  
2-3V1A  
Weight: 0.017 g (typ.)  
Note 2: Mounted on the FR4 board (glass-epoxy; 1.6 mm thick; Cu  
area, 645 mm2)  
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly  
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute  
maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2006-11-13  

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