SSM3J36FS
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type
SSM3J36FS
○Power Management Switches
•
•
1.5-V drive
Unit: mm
Low ON-resistance: R = 3.60 Ω (max) (@V
= -1.5 V)
= -1.8 V)
= -2.8 V)
= -4.5 V)
on
GS
: R = 2.70 Ω (max) (@V
on
GS
GS
GS
: R = 1.60 Ω (max) (@V
on
: R = 1.31 Ω (max) (@V
on
Absolute Maximum Ratings (Ta = 25 °C)
Characteristics
Drain-source voltage
Symbol
Rating
Unit
V
V
-20
±8
V
V
DSS
Gate-source voltage
GSS
DC
I
-330
D
Drain current
mA
Pulse
I
-660
DP
Drain power dissipation
Channel temperature
P
(Note1)
150
mW
°C
D
T
ch
150
T
stg
−55 to 150
°C
Storage temperature range
Note: Using continuously under heavy loads (e.g. the application of
high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
JEDEC
JEITA
―
―
TOSHIBA
2-2H1B
Please design the appropriate reliability upon reviewing the
Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate,
Weight: 2.4 mg (typ.)
etc).
Note1: Mounted on an FR4 board
(25.4 mm × 25.4 mm × 1.6mm, Cu Pad: 0.36 mm2 ×3)
Marking
Equivalent Circuit (top view)
3
3
P X
1
2
1
2
Handling Precaution
When handling individual devices (which are not yet mounted on a circuit board), ensure that the environment is
protected against static electricity. Operators should wear anti-static clothing, and containers and other objects that come
into direct contact with devices should be made of anti-static materials.
Usage Considerations
Let V be the voltage applied between gate and source that causes the drain current (I ) to below −1 mA for the
th
D
SSM3J36FS). Then, for normal switching operation, V
must be higher than V and V
must be lower than
GS(off)
GS(on)
th,
V
This relationship can be expressed as: V < V < V
GS(off) th GS(on).
th.
Take this into consideration when using the device.
1
2008-06-11