Document Number: MRF21045
Rev. 12, 10/2008
Freescale Semiconductor
Technical Data
RF Power Field Effect Transistors
N--Channel Enhancement--Mode Lateral MOSFETs
Designed for W--CDMA base station applications with frequencies from 2110
to 2170 MHz. Suitable for TDMA, CDMA and multicarrier amplifier applica-
tions. To be used in Class AB for PCN--PCS/cellular radio and WLL
applications.
MRF21045LR3
MRF21045LSR3
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Typical 2--carrier W--CDMA Performance for VDD = 28 Volts, IDQ = 500 mA,
f = 2157.5 MHz, Channel Bandwidth = 3.84 MHz, Adjacent Channels
measured over 3.84 MHz Bandwidth at f1 --5 MHz and f2 +5 MHz,
Distortion Products measured over a 3.84 MHz Bandwidth at f1 --10 MHz
and f2 +10 MHz, Peak/Avg. = 8.3 dB @ 0.01% Probability on CCDF.
Output Power — 10 Watts Avg.
2110--2170 MHz, 45 W, 28 V
LATERAL N--CHANNEL
RF POWER MOSFETs
Efficiency — 23.5%
Gain — 15 dB
IM3 — --37.5 dBc
ACPR — --41 dBc
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Capable of Handling 5:1 VSWR, @ 28 Vdc, 2140 MHz, 45 Watts CW
Output Power
Features
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Internally Matched for Ease of Use
High Gain, High Efficiency and High Linearity
Integrated ESD Protection
Designed for Maximum Gain and Insertion Phase Flatness
Excellent Thermal Stability
Characterized with Series Equivalent Large--Signal Impedance Parameters
Low Gold Plating Thickness on Leads, 40µ″ Nominal.
RoHS Compliant
CASE 465E--04, STYLE 1
NI--400
MRF21045LR3
In Tape and Reel. R3 Suffix = 250 Units per 32 mm, 13 Inch Reel.
CASE 465F--04, STYLE 1
NI--400S
MRF21045LSR3
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Vdc
Vdc
Drain--Source Voltage
Gate--Source Voltage
V
--0.5, +65
--0.5, +15
DSS
V
GS
Total Device Dissipation @ T = 25°C
P
105
W
C
D
Derate above 25°C
0.60
W/°C
Storage Temperature Range
Case Operating Temperature
Operating Junction Temperature
T
--65 to +150
150
°C
°C
°C
stg
T
C
T
200
J
Table 2. Thermal Characteristics
(1)
Characteristic
Thermal Resistance, Junction to Case
Table 3. ESD Protection Characteristics
Test Conditions
Symbol
Value
Unit
R
θ
JC
1.65
°C/W
Class
Human Body Model
Machine Model
1 (Minimum)
M2 (Minimum)
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
Freescale Semiconductor, Inc., 2008. All rights reserved.
MRF21045LR3 MRF21045LSR3
RF Device Data
Freescale Semiconductor
1