PD - 93777
IRFC2907B
HEXFET® Power MOSFET Die in Wafer Form
D
l 100% Tested at Probe
75V
RDS(on) = 2.5mΩ
(typ.)
l Available in Tape and Reel, Chip Pack,
Sawn on Film and Gel Pack**
l Ultra Low On-Resistance
G
6" Wafer
S
Electrical Characteristics *
Parameter
V(BR)DSS
RDS(on)***
VGS(th)
IDSS
Description
Min
75V
–––
2.0
Typ.
–––
Max
Test Conditions
Drain-to-Source Breakdown Voltage
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
–––
VGS = 0V, ID = 250µA
2.5mΩ
–––
4.5mΩ VGS = 10V, ID = 110A
4.0V
VDS = VGS, ID = 250µA
Drain-to-Source Leakage Current
Gate-to-Source Leakage Current
Operating Junction and
–––
–––
–––
20µA
VDS = 75V, VGS = 0V, TJ = 25°C
IGSS
–––
± 200nA VGS = ±20V
TJ
-55°C to 175°C Max.
TSTG
Storage Temperature Range
Mechanical Data
Nominal Back Metal Composition, Thickness:
Nominal Front Metal Composition, Thickness:
Dimensions:
Cr-NiV-Ag ( 1kA°-2kA°-5kA° )
100% Al (0.008 mm)
.257" x .360" [ 6.53 mm x 9.14 mm ]
150 mm, with 100 flat
Wafer Diameter:
Wafer Thickness:
0.254 mm ± 0.025 mm
Relevant Die Mechanical Drawing Number
Minimum Street Width
01-5403
0.107 mm
Reject Ink Dot Size
0.51 mm Diameter Minimum
Store in original container, in dessicated
nitrogen, with no contamination
For optimum electrical results, die attach
temperature should not exceed 300 °C
IRFP2907
Recommended Storage Environment:
Recommended Die Attach Conditions:
Reference Packaged Part
Die Outline
NOTES:
6.53
[.257]
1. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS [INCHES].
2. CONTROLLING DIMENSION: [INCH].
3. LETTER DESIGNATION:
S = SOURCE
GAT E
SK = SOURCE KELVIN
IS = CURRENTSENSE
E = EMITTER
G
=
4. DIMENS IONAL T OL ERANCES:
BONDING PADS:
WIDT H
<
<
>
>
0.635 TOLERANCE
[.0250] TOLERANCE = + /- [.0005]
0.635 TOLERANCE + /- 0.025
[.0250] TOLERANCE = + /- [.0010]
= + /- 0.013
SOURCE SOURCE
9.14
[.360]
&
=
LENGTH
OVERALL DIE:
WIDT H
<
<
>
>
1.270 TOLERANCE
[.050] TOLERANCE = + /- [.004]
1.270 TOLERANCE + /- 0.203
[.050] TOLERANCE = + /- [.008]
= + /- 0.102
GAT E
&
=
LENGTH
0.508
[.020]
0.508
[.020]
5. UNLESS OTHERWISE NOTED ALL DIE ARE GEN III
*
Electrical characteristics are reported for the reference packaged part (see above) and can not be guaranteed in
die sales form. Variations in customer packaging materials, dimensions and processes may affect parametric performance.
** Contact factory for these product forms.
***The typical RDS(on) is an estimated value for the bare die, actual results will depend on customer packaging materials and
dimensions.
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