Electrical Characteristics TJ = 25 °C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
ID = 250 μA, VGS = 0 V
100
V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient
I
D = 250 μA, referenced to 25 °C
74
mV/°C
IDSS
IGSS
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
VDS = 80 V, VGS = 0 V
VGS = ±20 V, VDS = 0 V
1
μA
±100
nA
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = 250 μA
2
3.1
-9
4
V
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient
I
D = 250 μA, referenced to 25 °C
VGS = 10 V, ID = 7 A
GS = 6 V, ID = 5.5 A
mV/°C
16
24
30
17
20
32
38
rDS(on)
gFS
Static Drain to Source On Resistance
Forward Transconductance
V
mΩ
VGS = 10 V, ID = 7 A, TJ = 125 °C
VDD = 5 V, ID = 7 A
S
Dynamic Characteristics
Ciss
Coss
Crss
Rg
Input Capacitance
734
168
6.6
980
225
15
pF
pF
pF
Ω
VDS = 50 V, VGS = 0 V
f = 1 MHz
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
0.1
1.3
3
Switching Characteristics
td(on)
tr
td(off)
tf
Turn-On Delay Time
Rise Time
8.4
2.6
14
17
10
25
10
16
11
ns
ns
VDD = 50 V, ID = 7 A
VGS = 10 V, RGEN = 6 Ω
Turn-Off Delay Time
Fall Time
ns
2.8
11
ns
Total Gate Charge
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
VGS = 0 V to 10 V
VGS = 0 V to 6 V
nC
nC
nC
nC
Qg(TOT)
7.3
3.4
2.5
VDD = 50 V
D = 7 A
I
Qgs
Qgd
Drain-Source Diode Characteristics
VSD
trr
Source to Drain Diode Forward Voltage
Reverse Recovery Time
VGS = 0 V, IS = 7 A
(Note 2)
0.8
43
44
1.2
70
71
V
ns
nC
IF = 7 A, di/dt = 100 A/μs
Qrr
Reverse Recovery Charge
NOTES:
2
1. R
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
is guaranteed by design while R
is determined by
θCA
θJA
θJC
the user's board design.
b.160 °C/W when mounted on
a minimum pad of 2 oz copper
a. 60 °C/W when mounted on
a 1 in padof 2oz copper
2
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
o
3. E of 121 mJ is based on starting T = 25 C, L = 3 mH, I = 9 A, V = 100 V, V = 10 V. 100% tested at L = 0.1 mH, I = 30 A.
AS
J
AS
DD
GS
AS
4. Pulse Id refers to Figure.11 Forward Bias Safe Operation Area.
2
www.fairchildsemi.com
©2014 Fairchild Semiconductor Corporation
FDMD84100 Rev.C