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NDT2955(J23Z) PDF预览

NDT2955(J23Z)

更新时间: 2022-01-18 17:09:00
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体晶体管
页数 文件大小 规格书
6页 94K
描述
TRANSISTOR | MOSFET | P-CHANNEL | 60V V(BR)DSS | 2.5A I(D) | SOT-223

NDT2955(J23Z) 数据手册

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September 1996  
NDT2955  
P-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
Power SOT P-Channel enhancement mode power field  
effect transistors are produced using Fairchild's  
proprietary, high cell density, DMOS technology. This very  
high density process is especially tailored to minimize  
on-state resistance and provide superior switching  
performance. These devices are particularly suited for low  
voltage applications such as notebook computer power  
management and DC motor control.  
-2.5A, -60V. RDS(ON) = 0.3W @ VGS = -10V.  
High density cell design for extremely low RDS(ON)  
.
High power and current handling capability in a widely used  
surface mount package.  
_______________________________________________________________________________________________________  
D
D
D
S
S
G
G
Absolute Maximum Ratings  
TA = 25°C unless otherwise noted  
Symbol Parameter  
NDT2955  
-60  
Units  
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
V
V
A
±20  
Drain Current  
- Continuous  
- Pulsed  
Maximum Power Dissipation  
(Note 1a)  
(Note 1a)  
-2.5  
-15  
3
W
PD  
1.3  
(Note 1b)  
(Note 1c)  
1.1  
TJ,TSTG  
Operating and Storage Temperature Range  
-65 to 150  
°C  
THERMAL CHARACTERISTICS  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1)  
42  
12  
°C/W  
°C/W  
R
JA  
q
Thermal Resistance, Junction-to-Case  
R
JC  
q
* Order option J23Z for cropped center drain lead.  
© 1997 Fairchild Semiconductor Corporation  
NDT2955 Rev. B2  

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