MCR703A Series
Preferred Device
Sensitive Gate
Silicon Controlled Rectifiers
Reverse Blocking Thyristors
PNPN devices designed for high volume, low cost consumer
applications such as temperature, light and speed control; process and
remote control; and warning systems where reliability of operation is
critical.
http://onsemi.com
SCRs
4.0 AMPERES RMS
100 − 600 VOLTS
Features
• Small Size
• Passivated Die Surface for Reliability and Uniformity
• Low Level Triggering and Holding Characteristics
• Recommend Electrical Replacement for C106
• Surface Mount Package − Case 369C
• To Obtain “DPAK” in Straight Lead Version (Shipped in Sleeves):
Add ’1’ Suffix to Device Number, i.e., MCR706A1
• Epoxy Meets UL 94 V−0 @ 0.125 in
G
A
K
MARKING
DIAGRAMS
• ESD Ratings:
Human Body Model, 3B u 8000 V
Machine Model, C u 400 V
4
DPAK
CASE 369C
STYLE 2
YWW
CR
70xAG
• Pb−Free Packages are Available
2
1
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
3
Rating
Symbol
Max
Unit
Peak Repetitive Off−State Voltage (Note 1)
V
V
V
DRM,
RRM
4
(T = −40 to +110°C, Sine Wave, 50 to 60 Hz,
C
Gate Open)
MCR703A
MCR706A
MCR708A
100
400
600
YWW
CR
70xAG
DPAK−3
CASE 369D
STYLE 2
Peak Non-Repetitive Off−State Voltage
(Sine Wave, 50 to 60 Hz, Gate Open,
V
V
RSM
1
2
3
T
C
= −40 to +110°C)
MCR703A
MCR706A
MCR708A
150
450
650
Y
= Year
WW = Work Week
70xA = Device Code
x = 3, 6 or 8
On−State RMS Current
(180° Conduction Angles; T = 90°C)
I
4.0
A
A
T(RMS)
C
G
= Pb−Free Package
Average On−State Current (180° Conduction
I
T(AV)
Angles)
T
C
T
C
= −40 to +90°C
= +100°C
2.6
1.6
PIN ASSIGNMENT
Gate
Non-Repetitive Surge Current
I
A
TSM
1
(1/2 Sine Wave, 60 Hz, T = 110°C)
(1/2 Sine Wave, 1.5 ms, T = 110°C)
25
35
J
J
2
3
4
Anode
2
2
Circuit Fusing (t = 8.3 msec)
I t
2.6
0.5
A sec
Cathode
Forward Peak Gate Power
P
W
W
A
GM
Anode
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
Forward Average Gate Power
P
0.1
0.2
G(AV)
(t = 8.3 msec, T = 90°C)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
C
Forward Peak Gate Current
I
GM
(Pulse Width ≤ 1.0 ꢀ sec, T = 90°C)
C
Operating Junction Temperature Range
Storage Temperature Range
T
−40 to +110
−40 to +150
°C
°C
J
Preferred devices are recommended choices for future use
and best overall value.
T
stg
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. V
and V
for all types can be applied on a continuous basis. Ratings apply for zero or negative gate voltage; however, positive gate
DRM
RRM
voltage shall not be applied concurrent with negative potential on the anode. Blocking voltages shall not be tested with a constant current
source such that the voltage ratings of the devices are exceeded.
©
Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
November, 2007 − Rev. 7
MCR703A/D