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IRHNA9064 PDF预览

IRHNA9064

更新时间: 2024-11-19 22:29:11
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管功率场效应晶体管开关脉冲
页数 文件大小 规格书
4页 100K
描述
TRANSISTOR P-CHANNEL(BVdss=-60V, Rds(on)=0.055ohm, Id=-48A)

IRHNA9064 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:CHIP CARRIER, R-CBCC-N3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.17
其他特性:HIGH RELIABILITY雪崩能效等级(Eas):500 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:60 V最大漏极电流 (Abs) (ID):48 A
最大漏极电流 (ID):48 A最大漏源导通电阻:0.048 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-CBCC-N3
JESD-609代码:e0元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:RECTANGULAR封装形式:CHIP CARRIER
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:P-CHANNEL
最大功率耗散 (Abs):300 W最大脉冲漏极电流 (IDM):192 A
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:Tin/Lead (Sn/Pb)
端子形式:NO LEAD端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

IRHNA9064 数据手册

 浏览型号IRHNA9064的Datasheet PDF文件第2页浏览型号IRHNA9064的Datasheet PDF文件第3页浏览型号IRHNA9064的Datasheet PDF文件第4页 
Previous Datasheet  
Index  
Next Data Sheet  
Provisional Data Sheet No. PD-9.1447  
REPETITIVE AVALANCHE AND dv/dt RATED  
HEXFET® TRANSISTOR  
IRHNA9064  
P-CHANNEL  
RADHARD  
-60Volt, 0.055Ω, RAD HARD HEXFET  
Product Summary  
International Rectifier’s P-Channel RAD HARD technology  
HEXFETs demonstrate excellent threshold voltage stability  
and breakdown voltage stability at total radiation doses as  
high as 105 Rads (Si). Under identical pre- and post-radia-  
tion test conditions, International Rectifier’s P-Channel RAD  
HARD HEXFETs retain identical electrical specifications up  
to 1 x 105 Rads (Si) total dose. No compensation in gate drive  
circuitry is required. These devices are also capable of sur-  
viving transient ionization pulses as high as 1 x 1012 Rads  
(Si)/Sec, and return to normal operation within a few micro-  
seconds. Single Event Effect (SEE) testing of International  
Rectifier P-Channel RAD HARD HEXFETs has demon-  
strated virtual immunity to SEE failure. Since the P-Chan-  
nel RAD HARD process utilizes International Rectifier’s  
patented HEXFET technology, the user can expect the high-  
est quality and reliability in the industry.  
Part Number  
BVDSS  
RDS(on)  
ID  
IRHNA9064  
-60V  
0.055Ω  
-48A  
Features:  
n
n
n
n
n
n
n
n
n
n
n
n
n
Radiation Hardened up to 1 x 105 Rads (Si)  
Single Event Burnout (SEB) Hardened  
Single Event Gate Rupture (SEGR) Hardened  
Gamma Dot (Flash X-Ray) Hardened  
Neutron Tolerant  
IdenticalPre-andPost-ElectricalTestConditions  
Repetitive Avalanche Rating  
Dynamic dv/dt Rating  
SimpleDriveRequirements  
Ease of Paralleling  
HermeticallySealed  
Surface Mount  
P-Channel RAD HARD HEXFET transistors also feature  
all of the well-established advantages of MOSFETs, such  
as voltage control, very fast switching, ease of paralleling  
and temperature stability of the electrical parameters.They  
are well-suited for applications such as switching power  
supplies, motor controls, inverters, choppers, audio amplifi-  
ers and high-energy pulse circuits in space and weapons  
environments.  
Light-Weight  
Pre-Radiation  
Absolute Maximum Ratings  
Parameter  
= -12V, T = 25°C Continuous Drain Current  
IRHNA9064  
-48  
Units  
I
@ V  
D
GS  
GS  
C
I
D
@ V  
= -12V, T = 100°C Continuous Drain Current  
-30  
A
C
I
Pulsed Drain Current   
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
-192  
300  
DM  
@ T = 25°C  
P
W
W/K ꢀ  
V
D
C
2.4  
V
± 20  
GS  
E
Single Pulse Avalanche Energy ‚  
Avalanche Current   
500  
mJ  
AS  
I
-48  
A
AR  
E
Repetitive Avalanche Energy   
Peak Diode Recovery dv/dt ƒ  
Operating Junction  
30  
mJ  
AR  
dv/dt  
-5.5  
V/ns  
T
-55 to 150  
J
T
Storage Temperature Range  
STG  
oC  
g
300 (For 5 sec)  
3.3 (typical)  
Package Mounting Surface Temperature  
Weight  
To Order  
 
 

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