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IRHNA9064SCSPBF PDF预览

IRHNA9064SCSPBF

更新时间: 2024-11-20 13:08:51
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英飞凌 - INFINEON 晶体晶体管功率场效应晶体管开关脉冲
页数 文件大小 规格书
4页 100K
描述
Power Field-Effect Transistor, 48A I(D), 60V, 0.048ohm, 1-Element, P-Channel, Silicon, Metal-oxide Semiconductor FET, HERMETIC SEALED, SMD2, 3 PIN

IRHNA9064SCSPBF 数据手册

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Previous Datasheet  
Index  
Next Data Sheet  
Provisional Data Sheet No. PD-9.1447  
REPETITIVE AVALANCHE AND dv/dt RATED  
HEXFET® TRANSISTOR  
IRHNA9064  
P-CHANNEL  
RADHARD  
-60Volt, 0.055Ω, RAD HARD HEXFET  
Product Summary  
International Rectifier’s P-Channel RAD HARD technology  
HEXFETs demonstrate excellent threshold voltage stability  
and breakdown voltage stability at total radiation doses as  
high as 105 Rads (Si). Under identical pre- and post-radia-  
tion test conditions, International Rectifier’s P-Channel RAD  
HARD HEXFETs retain identical electrical specifications up  
to 1 x 105 Rads (Si) total dose. No compensation in gate drive  
circuitry is required. These devices are also capable of sur-  
viving transient ionization pulses as high as 1 x 1012 Rads  
(Si)/Sec, and return to normal operation within a few micro-  
seconds. Single Event Effect (SEE) testing of International  
Rectifier P-Channel RAD HARD HEXFETs has demon-  
strated virtual immunity to SEE failure. Since the P-Chan-  
nel RAD HARD process utilizes International Rectifier’s  
patented HEXFET technology, the user can expect the high-  
est quality and reliability in the industry.  
Part Number  
BVDSS  
RDS(on)  
ID  
IRHNA9064  
-60V  
0.055Ω  
-48A  
Features:  
n
n
n
n
n
n
n
n
n
n
n
n
n
Radiation Hardened up to 1 x 105 Rads (Si)  
Single Event Burnout (SEB) Hardened  
Single Event Gate Rupture (SEGR) Hardened  
Gamma Dot (Flash X-Ray) Hardened  
Neutron Tolerant  
IdenticalPre-andPost-ElectricalTestConditions  
Repetitive Avalanche Rating  
Dynamic dv/dt Rating  
SimpleDriveRequirements  
Ease of Paralleling  
HermeticallySealed  
Surface Mount  
P-Channel RAD HARD HEXFET transistors also feature  
all of the well-established advantages of MOSFETs, such  
as voltage control, very fast switching, ease of paralleling  
and temperature stability of the electrical parameters.They  
are well-suited for applications such as switching power  
supplies, motor controls, inverters, choppers, audio amplifi-  
ers and high-energy pulse circuits in space and weapons  
environments.  
Light-Weight  
Pre-Radiation  
Absolute Maximum Ratings  
Parameter  
= -12V, T = 25°C Continuous Drain Current  
IRHNA9064  
-48  
Units  
I
@ V  
D
GS  
GS  
C
I
D
@ V  
= -12V, T = 100°C Continuous Drain Current  
-30  
A
C
I
Pulsed Drain Current   
Max. Power Dissipation  
Linear Derating Factor  
Gate-to-Source Voltage  
-192  
300  
DM  
@ T = 25°C  
P
W
W/K ꢀ  
V
D
C
2.4  
V
± 20  
GS  
E
Single Pulse Avalanche Energy ‚  
Avalanche Current   
500  
mJ  
AS  
I
-48  
A
AR  
E
Repetitive Avalanche Energy   
Peak Diode Recovery dv/dt ƒ  
Operating Junction  
30  
mJ  
AR  
dv/dt  
-5.5  
V/ns  
T
-55 to 150  
J
T
Storage Temperature Range  
STG  
oC  
g
300 (For 5 sec)  
3.3 (typical)  
Package Mounting Surface Temperature  
Weight  
To Order  
 
 

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