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IRHNA9260 PDF预览

IRHNA9260

更新时间: 2024-11-19 22:48:07
品牌 Logo 应用领域
英飞凌 - INFINEON /
页数 文件大小 规格书
8页 119K
描述
RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-2)

IRHNA9260 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:CHIP CARRIER, R-CBCC-N3Reach Compliance Code:compliant
ECCN代码:EAR99风险等级:5.17
其他特性:RADIATION HARDENED雪崩能效等级(Eas):500 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:200 V最大漏极电流 (Abs) (ID):29 A
最大漏极电流 (ID):29 A最大漏源导通电阻:0.159 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-CBCC-N3
JESD-609代码:e0元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:RECTANGULAR封装形式:CHIP CARRIER
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:P-CHANNEL
最大功率耗散 (Abs):300 W最大脉冲漏极电流 (IDM):116 A
认证状态:Not Qualified子类别:Other Transistors
表面贴装:YES端子面层:Tin/Lead (Sn/Pb)
端子形式:NO LEAD端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

IRHNA9260 数据手册

 浏览型号IRHNA9260的Datasheet PDF文件第2页浏览型号IRHNA9260的Datasheet PDF文件第3页浏览型号IRHNA9260的Datasheet PDF文件第4页浏览型号IRHNA9260的Datasheet PDF文件第5页浏览型号IRHNA9260的Datasheet PDF文件第6页浏览型号IRHNA9260的Datasheet PDF文件第7页 
PD - 93969  
IRHNA9260  
JANSR2N7426U  
200V,P-CHANNEL  
RADIATION HARDENED  
POWER MOSFET  
SURFACE MOUNT (SMD-2)  
Product Summary  
REF: MIL-PRF-19500/655  
RAD-HardHEXFET® TECHNOLOGY  
Part Number Radiation Level  
IRHNA9260 100K Rads (Si)  
IRHNA93260 300K Rads (Si)  
RDS(on)  
ID  
QPL Part Number  
0.154-29A JANSR2N7426U  
0.154-29A JANSF2N7426U  
SMD-2  
International Rectifier’s RAD-HardTM HEXFET®  
MOSFET technology provides high performance  
power MOSFETs for space applications. This tech-  
nology has over a decade of proven performance  
and reliability in satellite applications. These de-  
vices have been characterized for both Total Dose  
and Single Event Effects (SEE). The combination  
of low RDS(on) and low gate charge reduces the  
power losses in switching applications such as DC  
to DC converters and motor control. These de-  
vices retain all of the well established advantages  
of MOSFETs such as voltage control, fast switch-  
ing, ease of paralleling and temperature stability  
of electrical parameters.  
Features:  
n Single Event Effect (SEE) Hardened  
n Ultra Low RDS(on)  
n Low Total Gate Charge  
n Proton Tolerant  
n Simple Drive Requirements  
n Ease of Paralleling  
n Hermetically Sealed  
n Surface Mount  
n Ceramic Package  
n Light Weight  
Absolute Maximum Ratings  
Pre-Irradiation  
Parameter  
Units  
I
@ V  
@ V  
= -12V, T = 25°C  
Continuous Drain Current  
-29  
D
GS  
C
A
I
D
= -12V, T = 100°C Continuous Drain Current  
-18  
-116  
300  
GS  
C
I
Pulsed Drain Current  
DM  
@ T = 25°C  
P
Max.Power Dissipation  
W
W/°C  
V
D
C
Linear Derating Factor  
2.4  
V
GS  
Gate-to-SourceVoltage  
±20  
E
Single Pulse Avalanche Energy  
Avalanche Current ➀  
500  
mJ  
A
AS  
I
-29  
AR  
E
Repetitive Avalanche Energy ➀  
Peak Diode Recovery dv/dt ➀  
Operating Junction  
30  
mJ  
V/ns  
AR  
dv/dt  
-20  
T
-55 to 150  
J
T
Storage Temperature Range  
oC  
g
STG  
Pckg. Mounting Surface Temp.  
Weight  
300 (for 5s)  
3.3 (Typical)  
For footnotes refer to the last page  
www.irf.com  
1
11/21/00  

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