ꢁ
PD-96916
RADIATION HARDENED
POWER MOSFET
SURFACE MOUNT (TO-254AA Tabless)
IRHMJ57160
100V, N-CHANNEL
TECHNOLOGY
5
Product Summary
Part Number Radiation Level RDS(on)
ID
IRHMJ57160 100K Rads (Si)
IRHMJ53160 300K Rads (Si)
IRHMJ54160 600K Rads (Si)
0.018Ω 35A*
0.018Ω 35A*
0.018Ω 35A*
IRHMJ58160 1000K Rads (Si) 0.019Ω 35A*
TO-254AA Tabless
International Rectifier’s R5TM technology provides
high performance power MOSFETs for space
applications. These devices have been characterized
for Single Event Effects (SEE) with useful performance
up to an LET of 80 (MeV/(mg/cm2)). The combination
Features:
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Identical Pre- and Post-Electrical Test Conditions
Repetitive Avalanche Ratings
Dynamic dv/dt Ratings
Simple Drive Requirements
Ease of Paralleling
of low R
and low gate charge reduces the
DS(on)
power losses in switching applications such as DC
to DC converters and motor control. These devices
retain all of the well established advantages of
MOSFETs such as voltage control, fast switching,
ease of paralleling and temperature stability of
electrical parameters.
Hermatically Sealed
Electically Isolated
n
n
Ceramic Eyelets
Light Weight
Pre-Irradiation
Absolute Maximum Ratings
Parameter
Units
I
@ V
@ V
= 12V, T = 25°C
Continuous Drain Current
35*
D
D
GS
GS
C
A
I
= 12V, T = 100°C Continuous Drain Current
35*
140
C
I
Pulsed Drain Current À
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
DM
@ T = 25°C
P
250
W
W/°C
V
D
C
2.0
V
±20
GS
E
Single Pulse Avalanche Energy Á
Avalanche Current À
500
mJ
A
AS
I
35
AR
E
Repetitive Avalanche Energy À
Peak Diode Recovery dv/dt Â
Operating Junction
25
mJ
V/ns
AR
dv/dt
3.4
T
-55 to 150
J
oC
g
T
Storage Temperature Range
STG
Pckg. Mounting Surface Temp.
Weight
300 (for 5s)
3.7 (Typical)
* Current is limited by package
For footnotes refer to the last page
www.irf.com
1
12/24/04