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FDP14AN06LA PDF预览

FDP14AN06LA

更新时间: 2024-11-22 22:15:43
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 244K
描述
N-Channel PowerTrench MOSFET 60V, 60A, 14.6mз

FDP14AN06LA 数据手册

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January 2004  
FDB14AN06LA0 / FDP14AN06LA0  
®
N-Channel PowerTrench MOSFET  
60V, 60A, 14.6mΩ  
Features  
Applications  
rDS(ON) = 12.8m(Typ.), VGS = 5V, ID = 60A  
Qg(tot) = 24nC (Typ.), VGS = 5V  
Low Miller Charge  
Motor / Body Load Control  
ABS Systems  
Powertrain Management  
Injection Systems  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
DC-DC converters and Off-line UPS  
Distributed Power Architectures and VRMs  
Primary Switch for 12V and 24V systems  
Formerly developmental type 83557  
D
DRAIN  
(FLANGE)  
GATE  
SOURCE  
DRAIN  
GATE  
G
DRAIN  
SOURCE  
TO-263AB  
FDB SERIES  
(FLANGE)  
S
TO-220AB  
FDP SERIES  
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
60  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
V
V
±20  
Continuous (TC = 25oC, VGS = 10V)  
Continuous (TC = 25oC, VGS = 5V)  
Continuous (TA = 25oC, VGS = 5V, RθJA = 43oC/W)  
Pulsed  
67  
A
ID  
60  
10  
A
A
Figure 4  
46  
A
EAS  
Single Pulse Avalanche Energy (Note 1)  
mJ  
Power dissipation  
Derate above 25oC  
125  
W
PD  
0.83  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-220,TO-263  
Thermal Resistance Junction to Ambient TO-220,TO-263 (Note 2)  
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area  
1.2  
62  
43  
oC/W  
oC/W  
oC/W  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2004 Fairchild Semiconductor Corporation  
FDB14AN06LA0 / FDP14AN06LA0 Rev. B  

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