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FDP060AN08A0-F102 PDF预览

FDP060AN08A0-F102

更新时间: 2024-11-23 19:50:39
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
11页 252K
描述
Power Field-Effect Transistor, N-Channel, Metal-oxide Semiconductor FET

FDP060AN08A0-F102 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:,Reach Compliance Code:unknown
风险等级:5.84配置:Single
最大漏极电流 (Abs) (ID):80 AFET 技术:METAL-OXIDE SEMICONDUCTOR
工作模式:ENHANCEMENT MODE最高工作温度:175 °C
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):255 W
子类别:FET General Purpose Power表面贴装:NO
Base Number Matches:1

FDP060AN08A0-F102 数据手册

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November 2002  
FDB060AN08A0 / FDP060AN08A0  
®
N-Channel PowerTrench MOSFET  
75V, 80A, 6.0mΩ  
Features  
Applications  
rDS(ON) = 4.8m(Typ.), VGS = 10V, ID = 80A  
Qg(tot) = 73nC (Typ.), VGS = 10V  
Low Miller Charge  
42V Automotive Load Control  
Starter / Alternator Systems  
Electronic Power Steering Systems  
Electronic Valve Train Systems  
DC-DC converters and Off-line UPS  
Low QRR Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Qualified to AEC Q101  
Distributed Power Architectures and VRMs  
Primary Switch for 24V and 48V systems  
Formerly developmental type 82680  
D
DRAIN  
(FLANGE)  
GATE  
SOURCE  
DRAIN  
GATE  
G
DRAIN  
SOURCE  
(FLANGE)  
TO-220AB  
TO-263AB  
S
FDP SERIES  
FDB SERIES  
MOSFET Maximum Ratings TC = 25°C unless otherwise noted  
Symbol  
VDSS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
75  
V
V
±20  
Continuous (TC < 127oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 43oC/W)  
Pulsed  
80  
A
ID  
16  
Figure 4  
350  
A
A
EAS  
Single Pulse Avalanche Energy (Note 1)  
mJ  
Power dissipation  
Derate above 25oC  
255  
W
PD  
1.7  
W/oC  
oC  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case TO-220,TO-263  
0.58  
62  
oC/W  
oC/W  
oC/W  
Thermal Resistance Junction to Ambient TO-220,TO-263 (Note 2)  
Thermal Resistance Junction to Ambient TO-263, 1in2 copper pad area  
43  
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a  
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/  
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.  
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems  
certification.  
©2002 Fairchild Semiconductor Corporation  
FDB060AN08A0 / FDP060AN08A0 Rev. A  

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