R
NTD20N03
M
U W
30V N-Channel MOSFET
Features
Ultra−Low R
, Single Base, Advanced Technology
DS(on)
•
SPICE Parameters Available
•
•
•
•
Diode is Characterized for use in Bridge Circuits
I
and V
Specified at Elevated Temperatures
(on)
DSS
High Avalanche Energy Specified
Typical Applications
Power Supplies
•
Inductive Loads
D
•
PWM Motor Controls
•
V
(V) = 30V
DS
•
G
RDS(ON) < 27mΩ (VGS = 5V)
•
S
°
(T = 25 C unless otherwise noted)
MAXIMUM RATINGS
C
Rating
Symbol Value
Unit
Vdc
Vdc
Vdc
Drain−to−Source Voltage
V
30
30
DSS
DGR
Drain−to−Gate Voltage (R = 1.0 MW)
V
GS
Gate−to−Source Voltage
− Continuous
V
V
20
24
GS
GS
− Non−Repetitive (t v10 ms)
p
Drain Current
− Continuous @ T = 25_C
I
I
20
16
60
Adc
Apk
A
D
D
− Continuous @ T = 100_C
A
I
− Single Pulse (t v10 ms)
DM
p
Total Power Dissipation @ T = 25_C
P
D
74
0.6
1.75
W
W/°CW
A
Derate above 25°C
Total Power Dissipation @ T = 25°C (Note 1)
C
Operating and Storage Temperature Range
T , T
−55 to
150
°C
J
stg
Single Pulse Drain−to−Source Avalanche
E
AS
288
mJ
Energy − Starting T = 25°C
J
(V = 30 Vdc, V = 5 Vdc, L = 1.0 mH,
DD
GS
I
= 24 A, V = 34 Vdc)
L(pk)
DS
Thermal Resistance
− Junction−to−Case
°C/W
°C
R
R
R
1.67
100
71.4
q
JC
JA
JA
− Junction−to−Ambient
− Junction−to−Ambient (Note 1)
q
q
Maximum Lead Temperature for Soldering
Purposes, 1/8″ from case for 10 seconds
T
260
L
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
1. When surface mounted to an FR4 board using the minimum recommended
pad size and repetitive rating; pulse width limited by maximum junction
temperature.
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UTD Semiconductor Co.,Limited
1