NPN SILICON RF TRANSISTOR
NE662M04
NPN SILICON HIGH
FREQUENCY TRANSISTOR
FEATURES
•
•
•
•
HIGH GAIN BANDWIDTH: fT = 25 GHz
LOW NOISE FIGURE: NF = 1.1 dB at 2 GHz
HIGH MAXIMUM STABLE GAIN: 20 dB at f = 2 GHz
NEW LOW PROFILE M04 PACKAGE:
• SOT-343 footprint, with a height of just 0.59 mm
• Flat Lead Style for better RF performance
M04
DESCRIPTION
NEC's NE662M04 is fabricated using NEC's UHS0 25 GHz fT wafer process. With a typical transition frequency of 25 GHz the
NE662M04 is usable in applications from 100 MHz to 10 GHz. The NE662M04 provides excellent low voltage/low current
performance.
NEC'snewlowprofile/flatleadstyle"M04"packageisidealfortoday'sportablewirelessapplications.TheNE662M04isanidealchoice
for LNA and oscillator requirements in all mobile communication systems.
ELECTRICAL CHARACTERISTICS (TA = 25°C)
PART NUMBER
EIAJ1 REGISTERED NUMBER
PACKAGE OUTLINE
NE662M04
2SC5508
M04
SYMBOLS
PARAMETERS AND CONDITIONS
UNITS
nA
MIN
TYP
MAX
200
200
100
ICBO
IEBO
hFE
Collector Cutoff Current at VCB = 5V, IE = 0
Emitter Cutoff Current at VEB = 1 V, IC = 0
nA
Forward Current Gain2 at VCE = 2 V, IC = 5 mA
50
20
70
25
20
20
17
1.1
fT
Gain Bandwidth at VCE = 3 V, IC = 30 mA, f = 2 GHz
Maximum Available Power Gain4 at VCE = 2 V, IC = 20 mA, f = 2 GHz
Maximum Stable Gain5 at VCE = 2 V, IC = 20 mA, f = 2 GHz
Insertion Power Gain at VCE = 2 V, IC = 20 mA, f = 2 GHz
Noise Figure at VCE = 2 V, IC = 5 mA, f = 2 GHz, ZIN = ZOPT
GHz
dB
MAG
MSG
|S21E|2
NF
dB
dB
14
dB
1.5
P1dB
Output Power at 1 dB compression point at
VCE = 2 V, IC = 20 mA, f = 2 GHz
dBm
pF
11
22
IP3
Third Order Intercept Point at VCE = 2 V, IC = 20 mA, f = 2 GHz
Feedback Capacitance3 at VCB = 2 V, IC = 0, f = 1 MHz
Cre
0.18
0.24
Notes:
1. Electronic Industrial Association of Japan.
2. Pulsed measurement, pulse width ≤ 350 µs, duty cycle ≤ 2 %.
3. Capacitance is measured by capacitance meter (automatic balance bridge method) when emitter pin is connected to the guard pin.
S21
S12
(K- (K2 -1) )
4. MAG =
S21
S12
5. MSG =
The information in this document is subject to change without notice. Before using this document, please confirm
that this is the latest version.
Date Published: June 22, 2005