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NE66719 PDF预览

NE66719

更新时间: 2024-11-13 21:53:51
品牌 Logo 应用领域
CEL 晶体晶体管光电二极管放大器
页数 文件大小 规格书
8页 107K
描述
NECs NPN SILICON HIGH FREQUENCY TRANSISTOR

NE66719 数据手册

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NEC's NPN SILICON HIGH  
FREQUENCY TRANSISTOR  
NE66719  
FEATURES  
OUTLINE DIMENSIONS (Units in mm)  
HIGH GAIN BANDWIDTH: fT = 21 GHz  
LOW NOISE FIGURE: NF = 1.1 dB at 2 GHz  
HIGH MAXIMUM GAIN: 20 dB at f = 2 GHz  
PACKAGE OUTLINE 19  
1.6±0.1  
0.8±0.1  
2
DESCRIPTION  
NEC's NE66719 is fabricated using NEC's UHS0 25 GHz fT  
wafer process. This device is ideal for oscillator or low noise  
amplifier applications at 2 GHz and above.  
3
1
PIN CONNECTIONS  
1. Emitter  
2. Base  
3. Collector  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
PART NUMBER  
EIAJ1 REGISTERED NUMBER  
PACKAGE OUTLINE  
NE66719  
2SC55667  
19  
SYMBOLS  
PARAMETERS AND CONDITIONS  
UNITS  
nA  
MIN  
TYP  
MAX  
100  
100  
100  
ICBO  
IEBO  
hFE  
Collector Cutoff Current at VCB = 5V, IE = 0  
Emitter Cutoff Current at VEB = 1 V, IC = 0  
Forward Current Gain2 at VCE = 2 V, IC = 5 mA  
Gain Bandwidth at VCE = 2 V, IC = 20 mA, f = 2 GHz  
nA  
50  
18  
70  
21  
fT  
GHz  
dB  
MAG  
MSG  
|S21e|2  
|S21e|2  
NF  
Maximum Available Power Gain4 at VCE = 2 V, IC = 20 mA, f = 2 GHz  
Maximum Stable Gain5 at VCE = 2 V, IC = 20 mA, f = 2 GHz  
Insertion Power Gain at VCE = 1 V, IC = 10 mA, f = 2 GHz  
Insertion Power Gain at VCE = 2 V, IC = 20 mA, f = 2 GHz  
Noise Figure at VCE = 2 V, IC = 5 mA, f = 2 GHz, ZS = ZOPT  
Third Order Intercept Point at VCE = 2 V, IC = 20 mA, f = 2 GHz  
Feedback Capacitance3 at VCB = 2 V, IC = 0, f = 1 MHz  
12.5  
13.5  
11.0  
11.5  
1.1  
dB  
dB  
9.0  
9.5  
dB  
dB  
1.5  
IP3  
22  
Cre  
pF  
0.24  
0.30  
Notes:  
1. Electronic Industrial Association of Japan.  
2. Pulsed measurement, pulse width 350 µs, duty cycle 2 %.  
3. Capacitance is measured by capacitance meter (automatic balance bridge method) when emitter pin is connected to the guard pin.  
S21  
S12  
(K- (K2 -1) )  
4. MAG =  
S21  
5. MSG =  
S12  
California Eastern Laboratories  

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