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JANSR2N7472U2

更新时间: 2024-11-18 04:45:07
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英飞凌 - INFINEON /
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8页 181K
描述
RADIATION HARDENED POWER MOSFET SURFACE MOUNT(SMD-2)

JANSR2N7472U2 数据手册

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PD-93856D  
IRHNA57163SE  
JANSR2N7472U2  
130V, N-CHANNEL  
RADIATION HARDENED  
POWER MOSFET  
SURFACE MOUNT(SMD-2)  
REF: MIL-PRF-19500/684  
TECHNOLOGY  
5
™
Product Summary  
Part Number  
Radiation Level RDS(on)  
ID  
QPL Part Number  
IRHNA57163SE  
100K Rads (Si) 0.013575A* JANSR2N7472U2  
SMD-2  
International Rectifier’s R5TM technology provides  
high performance power MOSFETs for space  
applications. These devices have been characterized  
for Single Event Effects (SEE) with useful performance  
up to an LET of 80 (MeV/(mg/cm2)). The combination  
of low RDS(on) and low gate charge reduces the  
power losses in switching applications such as DC  
to DC converters and motor control. These devices  
retain all of the well established advantages of  
MOSFETs such as voltage control, fast switching,  
ease of paralleling and temperature stability of  
electrical parameters.  
Features:  
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened  
Ultra Low RDS(on)  
Low Total Gate Charge  
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Surface Mount  
Ceramic Package  
Light Weight  
Absolute Maximum Ratings  
Pre-Irradiation  
Parameter  
Units  
I
@ V  
= 12V, T = 25°C  
Continuous Drain Current  
75*  
D
GS  
GS  
C
A
I @ V  
D
= 12V, T = 100°C Continuous Drain Current  
57  
300  
C
I
Pulsed Drain Current À  
Max. Power Dissipation  
DM  
@ T = 25°C  
P
250  
W
W/°C  
V
D
C
Linear Derating Factor  
2.0  
V
Gate-to-Source Voltage  
Single Pulse Avalanche Energy Á  
Avalanche Current À  
±20  
GS  
E
280  
mJ  
A
AS  
I
75  
AR  
E
Repetitive Avalanche Energy À  
Peak Diode Recovery dv/dt   
Operating Junction  
25  
mJ  
V/ns  
AR  
dv/dt  
5.5  
T
-55 to 150  
J
T
Storage Temperature Range  
oC  
g
STG  
Pckg. Mounting Surface Temp.  
Weight  
300 (for 5s)  
3.3 (Typical)  
* Current is limited by package  
For footnotes refer to the last page  
www.irf.com  
1
04/25/06  

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