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FQU4N20L PDF预览

FQU4N20L

更新时间: 2024-11-18 22:18:19
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体晶体管功率场效应晶体管开关脉冲
页数 文件大小 规格书
9页 522K
描述
200V LOGIC N-Channel MOSFET

FQU4N20L 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TO-251包装说明:IN-LINE, R-PSIP-T3
针数:3Reach Compliance Code:unknown
ECCN代码:EAR99风险等级:5.77
Is Samacsys:N雪崩能效等级(Eas):52 mJ
配置:SINGLE WITH BUILT-IN DIODE最小漏源击穿电压:200 V
最大漏极电流 (Abs) (ID):3 A最大漏极电流 (ID):3.2 A
最大漏源导通电阻:1.4 ΩFET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:TO-251JESD-30 代码:R-PSIP-T3
JESD-609代码:e0元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):30 W最大脉冲漏极电流 (IDM):12.8 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:NO端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

FQU4N20L 数据手册

 浏览型号FQU4N20L的Datasheet PDF文件第2页浏览型号FQU4N20L的Datasheet PDF文件第3页浏览型号FQU4N20L的Datasheet PDF文件第4页浏览型号FQU4N20L的Datasheet PDF文件第5页浏览型号FQU4N20L的Datasheet PDF文件第6页浏览型号FQU4N20L的Datasheet PDF文件第7页 
December 2000  
TM  
QFET  
FQD4N20L / FQU4N20L  
200V LOGIC N-Channel MOSFET  
General Description  
Features  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary,  
planar stripe, DMOS technology.  
3.2A, 200V, R  
= 1.35@V = 10 V  
DS(on) GS  
Low gate charge ( typical 4.0 nC)  
Low Crss ( typical 6.0 pF)  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
This advanced technology is especially tailored to minimize  
on-state  
resistance,  
provide  
superior  
switching  
performance, and withstand high energy pulse in the  
avalanche and commutation modes. These devices are  
well suited for high efficiency switching DC/DC converters,  
switch mode power supplies, and motor control.  
Low level gate drive requirement allowing direct  
operation from logic drivers  
D
!
D
"
! "  
"
!
G
"
I-PAK  
FQU Series  
D-PAK  
FQD Series  
G
S
G
D
!
S
S
Absolute Maximum Ratings  
T = 25°C unless otherwise noted  
C
Symbol  
Parameter  
FQD4N20L / FQU4N20L  
Units  
V
V
I
Drain-Source Voltage  
200  
3.2  
DSS  
- Continuous (T = 25°C)  
Drain Current  
A
D
C
- Continuous (T = 100°C)  
2.02  
12.8  
± 20  
52  
A
C
I
(Note 1)  
Drain Current  
- Pulsed  
A
DM  
V
E
I
Gate-Source Voltage  
V
GSS  
AS  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
3.2  
AR  
E
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
3.0  
mJ  
V/ns  
W
AR  
dv/dt  
5.5  
Power Dissipation (T = 25°C) *  
2.5  
P
A
D
Power Dissipation (T = 25°C)  
30  
W
C
- Derate above 25°C  
Operating and Storage Temperature Range  
0.24  
-55 to +150  
W/°C  
°C  
T , T  
J
STG  
Maximum lead temperature for soldering purposes,  
1/8from case for 5 seconds  
T
300  
°C  
L
Thermal Characteristics  
Symbol  
Parameter  
Typ  
--  
Max  
4.17  
50  
Units  
°C/W  
°C/W  
°C/W  
R
R
R
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient *  
Thermal Resistance, Junction-to-Ambient  
θJC  
θJA  
θJA  
--  
--  
110  
* When mounted on the minimum pad size recommended (PCB Mount)  
©2000 Fairchild Semiconductor International  
Rev. A2, December 2000  

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