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FQD3N60CTF PDF预览

FQD3N60CTF

更新时间: 2024-11-30 10:23:31
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD /
页数 文件大小 规格书
8页 754K
描述
600V N-Channel MOSFET

FQD3N60CTF 技术参数

生命周期:Obsolete零件包装代码:TO-252
包装说明:SMALL OUTLINE, R-PSSO-G2针数:3
Reach Compliance Code:unknown风险等级:5.75
其他特性:AVALANCHE RATED雪崩能效等级(Eas):150 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:600 V最大漏极电流 (Abs) (ID):2.4 A
最大漏极电流 (ID):2.4 A最大漏源导通电阻:3.4 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-252
JESD-30 代码:R-PSSO-G2元件数量:1
端子数量:2工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):50 W
最大脉冲漏极电流 (IDM):9.6 A认证状态:Not Qualified
子类别:FET General Purpose Powers表面贴装:YES
端子形式:GULL WING端子位置:SINGLE
晶体管应用:SWITCHING晶体管元件材料:SILICON
Base Number Matches:1

FQD3N60CTF 数据手册

 浏览型号FQD3N60CTF的Datasheet PDF文件第2页浏览型号FQD3N60CTF的Datasheet PDF文件第3页浏览型号FQD3N60CTF的Datasheet PDF文件第4页浏览型号FQD3N60CTF的Datasheet PDF文件第5页浏览型号FQD3N60CTF的Datasheet PDF文件第6页浏览型号FQD3N60CTF的Datasheet PDF文件第7页 
January 2006  
TM  
QFET  
FQD3N60C  
600V N-Channel MOSFET  
Features  
Description  
2.4A, 600V, RDS(on) = 3.4@VGS = 10 V  
Low gate charge ( typical 10.5 nC)  
Low Crss ( typical 5 pF)  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficiency switched mode power supplies, active power factor  
correction, electronic lamp ballasts based on half bridge  
topology.  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
D
D
{
z
z
z
G
{
D-PAK  
G
S
FQD Series  
{
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FQD3N60C  
Unit  
VDSS  
Drain-Source Voltage  
Drain Current  
600  
V
ID  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
2.4  
1.5  
A
A
(Note 1)  
(Note 2)  
IDM  
Drain Current  
- Pulsed  
9.6  
±30  
150  
2.4  
5.0  
4.5  
A
V
VGSS  
EAS  
IAR  
Gate-Source voltage  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
(Note 1)  
(Note 1)  
(Note 3)  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
mJ  
V/ns  
Power Dissipation  
(TC = 25°C)  
50  
W
- Derate above 25°C  
0.4  
W/°C  
T
J, TSTG  
Operating and Storage Temperature Range  
-55 to +150  
300  
°C  
TL  
Maximum Lead Temperature for Soldering Purpose,  
1/8” from Case for 5 Seconds  
°C  
Thermal Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
2.5  
Unit  
°C/W  
°C/W  
°C/W  
RθJC  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient*  
Thermal Resistance, Junction-to-Ambient  
--  
--  
--  
RθJA  
RθJA  
*
50  
110  
* When mounted on the minimum pad size recommended (PCB Mount)  
©2006 Fairchild Semiconductor Corporation  
FQD3N60C REV. A  
1
www.fairchildsemi.com  

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