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FDC633N PDF预览

FDC633N

更新时间: 2024-11-20 22:49:03
品牌 Logo 应用领域
飞兆/仙童 - FAIRCHILD 晶体晶体管
页数 文件大小 规格书
4页 282K
描述
N-Channel Enhancement Mode Field Effect Transistor

FDC633N 数据手册

 浏览型号FDC633N的Datasheet PDF文件第2页浏览型号FDC633N的Datasheet PDF文件第3页浏览型号FDC633N的Datasheet PDF文件第4页 
March 1998  
FDC633N  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
5.2 A, 30 V. RDS(ON) = 0.042 W @ VGS = 4.5 V  
This N-Channel enhancement mode power field effect  
transistors is produced using Fairchild's proprietary, high cell  
density, DMOS technology. This very high density process is  
tailored to minimize on-state resistance. These devices are  
particularly suited for low voltage applications in notebook  
computers, portable phones, PCMICA cards, and other  
battery powered circuits where fast switching,low in-line  
power loss and resistance to transients are needed in a very  
small outline surface mount package.  
RDS(ON) = 0.054 W @ VGS = 2.5 V.  
SuperSOTTM-6 package design using copper lead frame for  
superior thermal and electrical capabilities.  
High density cell design for extremely low RDS(ON)  
.
Exceptional on-resistance and maximum DC current  
capability.  
SuperSOTTM-6  
SuperSOTTM-8  
SOIC-16  
SOT-223  
SO-8  
SOT-23  
S
1
6
5
4
D
D
2
3
G
D
1
pin  
SuperSOTTM -6  
D
Absolute Maximum Ratings TA = 25°C unless otherwise noted  
Symbol Parameter  
FDC633N  
Units  
Drain-Source Voltage  
30  
V
V
A
VDSS  
VGSS  
ID  
Gate-Source Voltage - Continuous  
Drain Current - Continuous  
- Pulsed  
±8  
5.2  
(Note 1a)  
16  
Maximum Power Dissipation  
(Note 1a)  
(Note 1b)  
1.6  
W
PD  
0.8  
Operating and Storage Temperature Range  
-55 to 150  
°C  
TJ,TSTG  
THERMAL CHARACTERISTICS  
RqJA  
RqJC  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
(Note 1a)  
(Note 1)  
78  
30  
°C/W  
°C/W  
© 1998 Fairchild Semiconductor Corporation  
FDC633N Rev.C  

FDC633N 替代型号

型号 品牌 替代类型 描述 数据表
FDC633N_NL FAIRCHILD

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