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RN2108ACT(TPL3) PDF预览

RN2108ACT(TPL3)

更新时间: 2024-09-26 14:44:31
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 152K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,80MA I(C),SOT-883

RN2108ACT(TPL3) 技术参数

生命周期:Obsolete包装说明:,
Reach Compliance Code:unknown风险等级:5.83
最大集电极电流 (IC):0.08 A最小直流电流增益 (hFE):80
元件数量:1极性/信道类型:PNP
最大功率耗散 (Abs):0.1 W子类别:BIP General Purpose Small Signal
表面贴装:YES晶体管元件材料:SILICON
Base Number Matches:1

RN2108ACT(TPL3) 数据手册

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RN2107ACT~RN2109ACT  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN2107ACT, RN2108ACT, RN2109ACT  
Switching, Inverter Circuit, Interface Circuit and  
Driver Circuit Applications  
Unit: mm  
Top View  
0.6±0.05  
0.5±0.03  
Extra small package (CST3) is applicable for extra high density  
fabrication.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN1107ACT to RN1109ACT  
0.05±0.03  
0.35±0.02  
0.15±0.03  
Equivalent Circuit and Bias Resistor Values  
C
1.BASE  
2.EMITTER  
3.COLLECOTR  
Type No.  
R1 (kΩ)  
R2 (kΩ)  
CST3  
RN2107ACT  
RN2108ACT  
RN2109ACT  
10  
22  
47  
47  
47  
22  
R1  
B
JEDEC  
JEITA  
TOSHIBA  
2-1J1A  
E
Weight: 0.75 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
V
V
50  
50  
V
V
CBO  
CEO  
RN2107ACT to RN2109ACT  
Collector-emitter voltage  
RN2107ACT  
6  
Emitter-base voltage  
V
V
RN2108ACT  
RN2109ACT  
7  
EBO  
15  
Collector current  
I
80  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
100*  
150  
C
RN2107ACT to RN2109ACT  
T
j
T
stg  
55 to 150  
°C  
* : Mounted on FR4 board (10 mm × 10 mm × 1 mm)  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant  
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating  
conditions (i.e.operatingtemperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
Start of commercial production  
2004-08  
1
2014-03-01  

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