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NLV14012BDG PDF预览

NLV14012BDG

更新时间: 2024-09-16 01:16:51
品牌 Logo 应用领域
安森美 - ONSEMI 光电二极管逻辑集成电路触发器
页数 文件大小 规格书
7页 105K
描述
Dual 4-Input NAND Gates

NLV14012BDG 技术参数

是否无铅: 不含铅生命周期:Active
零件包装代码:SOIC包装说明:SOP, SOP14,.25
针数:14Reach Compliance Code:compliant
HTS代码:8542.39.00.01Factory Lead Time:51 weeks
风险等级:5.69系列:4000/14000/40000
JESD-30 代码:R-PDSO-G14JESD-609代码:e3
长度:8.65 mm负载电容(CL):50 pF
逻辑集成电路类型:NAND GATE湿度敏感等级:1
功能数量:2输入次数:4
端子数量:14最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP14,.25
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:RAIL电源:5/15 V
Prop。Delay @ Nom-Sup:300 ns传播延迟(tpd):300 ns
认证状态:Not Qualified施密特触发器:NO
筛选级别:AEC-Q100座面最大高度:1.75 mm
子类别:Gates最大供电电压 (Vsup):18 V
最小供电电压 (Vsup):3 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Tin (Sn)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL宽度:3.9 mm
Base Number Matches:1

NLV14012BDG 数据手册

 浏览型号NLV14012BDG的Datasheet PDF文件第2页浏览型号NLV14012BDG的Datasheet PDF文件第3页浏览型号NLV14012BDG的Datasheet PDF文件第4页浏览型号NLV14012BDG的Datasheet PDF文件第5页浏览型号NLV14012BDG的Datasheet PDF文件第6页浏览型号NLV14012BDG的Datasheet PDF文件第7页 
MC14012B  
Dual 4-Input NAND Gates  
The MC14012B dual 4−input NAND gates are constructed with  
P−Channel and N−Channel enhancement mode devices in a single  
monolithic structure (Complementary MOS). Their primary use is  
where low power dissipation and/or high noise immunity is desired.  
http://onsemi.com  
Features  
Supply Voltage Range = 3.0 Vdc to 18 Vdc  
All Outputs Buffered  
Capable of Driving Two Low−Power TTL Loads or One Low−Power  
Schottky TTL Load Over the Rated Temperature Range  
Double Diode Protection on All Inputs  
Pin−for−Pin Replacements for Corresponding CD4000 Series B  
Suffix Devices  
SOIC−14  
D SUFFIX  
CASE 751A  
MARKING DIAGRAM  
NLV Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC−Q100  
Qualified and PPAP Capable  
14  
14012BG  
AWLYWW  
This Device is Pb−Free and is RoHS Compliant  
1
MAXIMUM RATINGS (Voltages Referenced to V  
)
SS  
A
WL, L  
YY, Y  
= Assembly Location  
= Wafer Lot  
= Year  
Symbol  
Parameter  
Value  
0.5 to +18.0  
Unit  
V
V
DD  
DC Supply Voltage Range  
WW, W = Work Week  
V , V  
in out  
Input or Output Voltage Range  
(DC or Transient)  
0.5 to V + 0.5  
V
DD  
G
= Pb−Free Package  
I , I  
in out  
Input or Output Current  
(DC or Transient) per Pin  
10  
mA  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 2 of this data sheet.  
P
D
Power Dissipation, per Package  
(Note 1)  
500  
mW  
T
Ambient Temperature Range  
Storage Temperature Range  
55 to +125  
65 to +150  
260  
°C  
°C  
°C  
A
T
stg  
T
Lead Temperature  
L
(8−Second Soldering)  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. Temperature Derating: “D/DW” Package: –7.0 mW/_C From 65_C To 125_C  
This device contains protection circuitry to guard against damage due to high  
static voltages or electric fields. However, precautions must be taken to avoid  
applications of any voltage higher than maximum rated voltages to this  
high−impedance circuit. For proper operation, V and V should be constrained  
in  
out  
to the range V (V or V ) V .  
SS  
in  
out  
DD  
Unused inputs must always be tied to an appropriate logic voltage level  
(e.g., either V or V ). Unused outputs must be left open.  
SS  
DD  
© Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
July, 2014 − Rev. 11  
MC14012B/D  
 

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