NGD15N41CL,
NGB15N41CL,
NGP15N41CL
Preferred Device
Ignition IGBT
15 Amps, 410 Volts
N−Channel DPAK, D2PAK and TO−220
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Over−Voltage clamped
protection for use in inductive coil drivers applications. Primary uses
include Ignition, Direct Fuel Injection, or wherever high voltage and
high current switching is required.
http://onsemi.com
15 AMPS
410 VOLTS
VCE(on) 3 2.1 V @
IC = 10 A, VGE . 4.5 V
C
Features
• Ideal for Coil−on−Plug Applications
• DPAK Package Offers Smaller Footprint and Increased Board Space
• Gate−Emitter ESD Protection
• Temperature Compensated Gate−Collector Voltage Clamp Limits
Stress Applied to Load
R
G
G
R
GE
• Integrated ESD Diode Protection
• New Design Increases Unclamped Inductive Switching (UIS) Energy
E
Per Area
• Low Threshold Voltage to Interface Power Loads to Logic or
Microprocessor Devices
• Low Saturation Voltage
4
DPAK
CASE 369C
STYLE 2
2
1
3
• High Pulsed Current Capability
• Optional Gate Resistor (R ) and Gate−Emitter Resistor (R
)
G
GE
2
4
• Pb−Free Packages are Available
D PAK
CASE 418B
STYLE 4
1
2
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
3
Rating
Collector−Emitter Voltage
Collector−Gate Voltage
Gate−Emitter Voltage
Symbol Value
Unit
V
CES
V
CER
440
440
15
V
V
V
DC
DC
DC
4
V
GE
Collector Current−Continuous
I
15
50
A
A
TO−220AB
CASE 221A
STYLE 9
C
DC
AC
@ T = 25°C − Pulsed
C
ESD (Human Body Model)
ESD
kV
R = 1500 Ω, C = 100 pF
8.0
1
ESD (Machine Model) R = 0 Ω, C = 200 pF
ESD
800
V
2
3
Total Power Dissipation @ T = 25°C
P
107
Watts
C
D
Derate above 25°C
0.71
W/°C
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 8 of this data sheet.
Operating and Storage Temperature Range
T , T
−55 to
+175
°C
J
stg
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
DEVICE MARKING INFORMATION
See general marking information in the device marking
section on page 8 of this data sheet.
Preferred devices are recommended choices for future use
and best overall value.
©
Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
May, 2006 − Rev. 7
NGD15N41CL/D