NGB8206N, NGB8206AN
Ignition IGBT
20 A, 350 V, N−Channel D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Overvoltage clamped
protection for use in inductive coil drivers applications. Primary uses
include Ignition, Direct Fuel Injection, or wherever high voltage and
high current switching is required.
http://onsemi.com
20 AMPS, 350 VOLTS
Features
VCE(on) = 1.3 V @
• Ideal for Coil−on−Plug and Driver−on−Coil Applications
• Gate−Emitter ESD Protection
IC = 10 A, VGE . 4.5 V
• Temperature Compensated Gate−Collector Voltage Clamp Limits
C
Stress Applied to Load
• Integrated ESD Diode Protection
• Low Threshold Voltage for Interfacing Power Loads to Logic or
R
G
G
Microprocessor Devices
• Low Saturation Voltage
R
GE
• High Pulsed Current Capability
• These are Pb−Free Devices
E
Applications
MARKING DIAGRAM
• Ignition Systems
4 Collector
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Collector−Emitter Voltage
Collector−Gate Voltage
Gate−Emitter Voltage
Symbol
Value
390
Unit
V
GB
8206xxG
AYWW
V
CES
1
2
V
CER
390
V
D PAK
CASE 418B
STYLE 4
V
GE
$15
20
50
V
1
Gate
3
Emitter
2
Collector Current−Continuous
I
C
A
DC
A
AC
@ T = 25°C − Pulsed
Collector
C
Continuous Gate Current
I
I
1.0
20
mA
mA
kV
G
GB8206xx = Device Code
xx = N or AN
Transient Gate Current (t ≤ 2 ms, f ≤ 100 Hz)
ESD (Charged−Device Model)
G
A
= Assembly Location
ESD
ESD
2.0
Y
= Year
WW
G
= Work Week
= Pb−Free Package
ESD (Human Body Model)
R = 1500 W, C = 100 pF
kV
8.0
ESD (Machine Model) R = 0 W, C = 200 pF
ESD
500
V
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
Total Power Dissipation @ T = 25°C
P
D
150
1.0
W
W/°C
C
Derate above 25°C
Operating & Storage Temperature Range
T , T
−55 to
+175
°C
J
stg
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
© Semiconductor Components Industries, LLC, 2012
1
Publication Order Number:
February, 2012 − Rev. 9
NGB8206N/D