NGB8202N
Ignition IGBT
20 A, 400 V, N−Channel D2PAK
This Logic Level Insulated Gate Bipolar Transistor (IGBT) features
monolithic circuitry integrating ESD and Overvoltage clamped
protection for use in inductive coil drivers applications. Primary uses
include Ignition, Direct Fuel Injection, or wherever high voltage and
high current switching is required.
http://onsemi.com
20 AMPS
400 VOLTS
VCE(on) = 1.3 V @
IC = 10 A, VGE . 4.5 V
Features
• Ideal for Coil−on−Plug and Driver−on−Coil Applications
• Gate−Emitter ESD Protection
• Temperature Compensated Gate−Collector Voltage Clamp Limits
Stress Applied to Load
C
• Integrated ESD Diode Protection
• Low Threshold Voltage for Interfacing Power Loads to Logic or
Microprocessor Devices
R
G
G
• Low Saturation Voltage
• High Pulsed Current Capability
R
GE
• Optional Gate Resistor (R ) and Gate−Emitter Resistor (R
)
G
GE
Applications
• Ignition Systems
E
MARKING
DIAGRAM
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
Rating
Collector−Emitter Voltage
Collector−Gate Voltage
Gate−Emitter Voltage
Symbol
Value
440
Unit
V
NG
B8202N
YWW
V
CES
V
440
V
CER
2
D PAK
CASE 418B
STYLE 4
V
"15
V
GE
Collector Current−Continuous
I
20
50
A
DC
A
AC
C
@ T = 25°C − Pulsed
C
NGB8202N= Device Code
Continuous Gate Current
I
I
1.0
20
mA
mA
kV
G
G
Y
= Year
Transient Gate Current (t≤2 ms, f≤100 Hz)
ESD (Charged−Device Model)
WW
= Work Week
ESD
ESD
2.0
ORDERING INFORMATION
ESD (Human Body Model)
R = 1500 W, C = 100 pF
kV
†
8.0
Device
NGB8202NT4
Package
Shipping
2
ESD (Machine Model) R = 0 W, C = 200 pF
ESD
500
V
D PAK
800 / Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Total Power Dissipation @ T = 25°C
P
150
1.0
Watts
C
D
Derate above 25°C
W/°C
Operating & Storage Temperature Range
T , T
J
−55 to +175
°C
stg
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
Semiconductor Components Industries, LLC, 2005
1
Publication Order Number:
January, 2005 − Rev. 1
NGB8202N/D