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NE76038-T1 PDF预览

NE76038-T1

更新时间: 2024-11-19 22:45:23
品牌 Logo 应用领域
日电电子 - NEC 晶体小信号场效应晶体管射频小信号场效应晶体管放大器
页数 文件大小 规格书
6页 44K
描述
LOW NOISE L TO Ku-BAND GaAs MESFET

NE76038-T1 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, S-PQSO-G4
针数:4Reach Compliance Code:unknown
HTS代码:8541.21.00.75风险等级:5.79
Is Samacsys:N其他特性:LOW NOISE
配置:SINGLE最小漏源击穿电压:5 V
FET 技术:METAL SEMICONDUCTOR最高频带:X BAND
JESD-30 代码:S-PQSO-G4元件数量:1
端子数量:4工作模式:DEPLETION MODE
封装主体材料:PLASTIC/EPOXY封装形状:SQUARE
封装形式:SMALL OUTLINE极性/信道类型:N-CHANNEL
最小功率增益 (Gp):12 dB认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:QUAD晶体管元件材料:GALLIUM ARSENIDE
Base Number Matches:1

NE76038-T1 数据手册

 浏览型号NE76038-T1的Datasheet PDF文件第2页浏览型号NE76038-T1的Datasheet PDF文件第3页浏览型号NE76038-T1的Datasheet PDF文件第4页浏览型号NE76038-T1的Datasheet PDF文件第5页浏览型号NE76038-T1的Datasheet PDF文件第6页 
LOW NOISE  
L TO Ku-BAND GaAs MESFET  
NE76038  
NOISE FIGURE & ASSOCIATED  
FEATURES  
GAIN vs. FREQUENCY  
VDS = 3 V, IDS = 10 mA  
LOW NOISE FIGURE:  
1.8 dB typical at 12 GHz  
4
3.5  
3
24  
21  
HIGH ASSOCIATED GAIN:  
7.5 dB typical at 12 GHz  
Ga  
18  
15  
12  
LG = 0.3 µm, WG = 280 µm  
2.5  
2
LOW COST PLASTIC PACKAGING  
TAPE & REEL PACKAGING OPTION AVAILABLE  
1.5  
1
9
6
NF  
0.5  
0
3
0
DESCRIPTION  
NE76038 is a high performance gallium arsenide metal  
semiconductor field effect transistor housed in a plastic  
package. Its low noise figure makes this device appropriate  
for use in the second or third stages of low noise amplifiers  
operating in the 1 - 14 GHz frequency range. The device is  
fabricated using ion implantation for improved RF and DC  
performance, reliability, and uniformity. These devices fea-  
ture a recessed 0.3 micron gate and triple epitaxial technol-  
ogy.  
1
10  
20  
Frequency, f (GHz)  
NEC's stringent quality assurance and test procedures en-  
sure the highest reliability and performance.  
ELECTRICAL CHARACTERISTICS (TA = 25°C)  
PART NUMBER  
PACKAGE OUTLINE  
NE76038  
38  
SYMBOLS  
PARAMETERS AND CONDITIONS  
UNITS  
MIN  
TYP  
MAX  
NFOPT1  
Optimum Noise Figure at VDS = 3 V, IDS = 10 mA  
f = 4 GHz  
f = 12 GHz  
dB  
dB  
0.8  
1.8  
1.2  
GA  
Associated Gain at VDS = 3 V, IDS = 10 mA  
f = 4 GHz  
f = 12 GHz  
dB  
dB  
12.0  
13.0  
7.5  
IDSS  
VP  
Saturated Drain Current at VDS = 3 V, VGS = 0 V  
Pinch-off Voltage at VDS = 3 V, IDS = 0.1 mA  
Transconductance at VDS = 3 V, IDS = 10 mA  
Gate to Source Leakage Current at VGS = -3 V  
mA  
V
15  
-3.0  
30  
30  
-0.8  
40  
50  
-0.5  
70  
gm  
mS  
µA  
IGSO  
10  
Note:  
1. Typical values of noise figures are those obtained when 50% of the devices from a large number of lots were individually measured in a circuit  
with the input individually tuned to obtain the minimum value. Maximum values are criteria established on the production line as a "go-no-go"  
screening test with the fixture tuned for the "generic" type but not for each specimen.  
California Eastern Laboratories  

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