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K9F2808U0A

更新时间: 2024-11-04 22:06:51
品牌 Logo 应用领域
三星 - SAMSUNG 闪存
页数 文件大小 规格书
26页 352K
描述
16M x 8 Bit NAND Flash Memory

K9F2808U0A 数据手册

 浏览型号K9F2808U0A的Datasheet PDF文件第2页浏览型号K9F2808U0A的Datasheet PDF文件第3页浏览型号K9F2808U0A的Datasheet PDF文件第4页浏览型号K9F2808U0A的Datasheet PDF文件第5页浏览型号K9F2808U0A的Datasheet PDF文件第6页浏览型号K9F2808U0A的Datasheet PDF文件第7页 
K9F2808U0A-YCB0, K9F2808U0A-YIB0  
FLASH MEMORY  
Document Title  
16M x 8 Bit NAND Flash Memory  
Revision History  
Revision No. History  
Draft Date  
Remark  
0.0  
0.1  
0.2  
Initial issue.  
April 10th 1999  
Advanced  
Information  
1. Revised real-time map-out algorithm(refer to technical notes)  
July 23th 1999  
Sep. 15th 1999  
1. Changed device name  
- KM29U128AT -> K9F2808U0A-YCB0  
- KM29U128AIT -> K9F2808U0A-YIB0  
0.3  
1. Changed sequential row read opera tion  
Mar. 21th 2000  
Preliminary  
Preliminary  
Final  
- The Sequential Read 1 and 2 operation is allowed only within a block  
2. Changed invalid block(s) marking method prior to shipping  
- The invalid block(s) information is written the 1st or 2nd page of the  
invalid block(s) with 00h data  
--->The invalid block(s) status is defined by the 6th byte in the spare  
area. Samsung makes sure that either the 1st or 2nd page of every  
invalid block has 00h data at the column address of 517.  
0.4  
1. Changed endurance : 1million -> 100K program/erase cycles  
2. Changed invalid block(s) marking method prior to shipping  
- The invalid block(s) status is defined by the 6th byte in the spare  
area. Samsung makes sure that either the 1st or 2nd page of every  
invalid block has 00h data at the column address of 517.  
May 15th 2000  
--->The invalid block(s) status is defined by the 6th byte in the spare  
area. Samsung makes sure that either the 1st or 2nd page of every  
invalid block has non-FFh data at the column address of 517.  
0.5  
0.6  
1. Changed SE pin description  
- SE is recommended to coupled to GND or Vcc and should not be  
toggled during reading or programming.  
July 17th 2000  
Nov. 20th 2000  
1. Changed don’t care mode in address cycles  
- *X can be "High" or "Low" => *L must be set to "Low"  
2. Explain how pointer operation works in detail.  
3. Renamed GND input (pin # 6) on behalf of SE (pin # 6)  
- The SE input controls the access of the spare area. When SE is high,  
the spare area is not accessible for reading or programming. SE is rec  
ommended to be coupled to GND or Vcc and should not be toggled  
during reading or programming.  
=> Connect this input pin to GND or set to static low state unless the  
sequential read mode excluding spare area is used.  
4. Updated operation for tRST timing  
- If reset command(FFh) is written at Ready state, the device goes into  
Busy for maximum 5us.  
Note : For more detailed features and specifications including FAQ, please refer to Samsung’s Flash web site.  
http://www.intl.samsungsemi.com/Memory/Flash/datasheets.html  
The attached datasheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right  
to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions about device. If you have  
any questions, please contact the SAMSUNG branch office near you.  
1

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