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2SD2621 PDF预览

2SD2621

更新时间: 2024-11-19 22:52:47
品牌 Logo 应用领域
松下 - PANASONIC 驱动器
页数 文件大小 规格书
3页 82K
描述
Silicon NPN epitaxial planar type For low-frequency driver amplification

2SD2621 数据手册

 浏览型号2SD2621的Datasheet PDF文件第2页浏览型号2SD2621的Datasheet PDF文件第3页 
Transistors  
2SD2621  
Silicon NPN epitaxial planar type  
For low-frequency driver amplification  
Unit: mm  
+0.05  
–0.02  
+0.05  
0.33  
0.10  
–0.02  
3
Features  
High forward current transfer ratio hFE  
Low collector-emitter saturation voltage VCE(sat)  
High emitter-base voltage (Collector open) VEBO  
+0.05  
1
2
0.23  
–0.02  
(0.40)(0.40)  
0.80 0.05  
1.20 0.05  
Absolute Maximum Ratings Ta = 25°C  
Parameter  
Symbol  
VCBO  
VCEO  
VEBO  
IC  
Rating  
Unit  
V
5˚  
Collector-base voltage (Emitter open)  
Collector-emitter voltage (Base open)  
Emitter-base voltage (Collector open)  
Collector current  
100  
100  
V
15  
20  
V
mA  
mA  
mW  
°C  
1 : Base  
Peak collector current  
ICP  
50  
2 : Emitter  
3 : Collector  
Collector power dissipation  
Junction temperature  
PC  
100  
SSSMini3-F1 Package  
Tj  
125  
Marking Symbol: 3B  
Storage temperature  
Tstg  
55 to +125  
°C  
Electrical Characteristics Ta = 25°C 3°C  
Parameter  
Symbol  
VCBO  
VCEO  
VEBO  
ICBO  
Conditions  
Min  
100  
100  
15  
Typ  
Max  
Unit  
V
Collector-base voltage (Emitter open)  
Collector-emitter voltage (Base open)  
Emitter-base voltage (Collector open)  
Collector-base cutoff current (Emitter open)  
Collector-emitter cutoff current (Base open)  
Forward current transfer ratio  
Collector-emitter saturation voltage  
Transition frequency  
IC = 10 µA, IE = 0  
IC = 1 mA, IB = 0  
V
IE = 10 µA, IC = 0  
VCB = 60 V, IE = 0  
VCE = 60 V, IB = 0  
VCE = 10 V, IC = 2 mA  
V
0.1  
1.0  
µA  
µA  
ICEO  
hFE  
400  
1200  
0.20  
VCE(sat) IC = 10 mA, IB = 1 mA  
0.05  
200  
80  
V
fT  
VCB = 10 V, IE = −2 mA, f = 200 MHz  
MHz  
mV  
Noise voltage  
NV  
VCE = 10 V, IC = 1 mA, GV = 80 dB  
Rg = 100 k, Function = FLAT  
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.  
Publication date: June 2004  
SJC00307AED  
1

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