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TPC8305_06 PDF预览

TPC8305_06

更新时间: 2024-11-21 08:40:07
品牌 Logo 应用领域
东芝 - TOSHIBA 电池PC
页数 文件大小 规格书
7页 1064K
描述
Lithium Ion Battery ApplicationsPortable Equipment ApplicationsNotebook PC Applications

TPC8305_06 数据手册

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TPC8305  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (UMOSII)  
TPC8305  
Lithium Ion Battery Applications  
Unit: mm  
Portable Equipment Applications  
Notebook PC Applications  
z
z
z
z
z
Small footprint due to small and thin package  
Low drainsource ON resistance : R  
= 24 m(typ.)  
DS (ON)  
High forward transfer admittance : |Y | = 12 S (typ.)  
fs  
Low leakage current : I  
= 10 µA (max) (V  
= 20 V)  
DSS  
DS  
Enhancement mode : V = 0.5~ 1.2 V (V  
= 10 V, I = 1mA)  
th  
DS  
D
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
20  
20  
±12  
5  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
DGR  
GS  
V
GSS  
JEDEC  
JEITA  
DC  
(Note 1)  
I
D
Drain curren  
A
Pulse  
I
20  
DP  
Single-device  
operation  
TOSHIBA  
2-6J1E  
P
1.5  
1.0  
D (1)  
Drain power  
dissipation  
(t = 10s)  
(Note 3a)  
Weight: 0.08 g (typ.)  
W
Single-device value  
at dual operation  
(Note 3b)  
(Note 2a)  
P
D(2)  
D (1)  
D (2)  
Circuit Configuration  
Single-device  
operation  
P
P
0.75  
0.45  
Drain power  
dissipation  
(t = 10s)  
(Note 3a)  
W
Single-device value  
at dual operation  
(Note 3b)  
(Note 2b)  
Single pulse avalanche energy  
(Note 4)  
E
32.5  
mJ  
A
AS  
Avalanche current  
(Note 1)  
I
5  
AR  
Repetitive avalanche energy  
Single-device value at operation  
(Note 2a, Note 3b, Note 5)  
E
0.10  
mJ  
AR  
Channel temperature  
T
150  
°C  
°C  
ch  
Storage temperature range  
T
stg  
55~150  
Note: (Note 1), (Note 2a), (Note 2b), (Note 3a), (Note 3b), (Note 4) and (Note 5): See the next page.  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in  
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.  
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate  
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and  
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).  
This transistor is an electrostatic-sensitive device. Please handle with caution.  
1
2006-11-16  

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