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TC55VD836FF-143 PDF预览

TC55VD836FF-143

更新时间: 2024-09-19 21:05:27
品牌 Logo 应用领域
东芝 - TOSHIBA 静态存储器内存集成电路
页数 文件大小 规格书
21页 567K
描述
IC 256K X 36 STANDARD SRAM, 4 ns, PQFP100, 14 X 20 MM, 1.60 MM HEIGHT, 0.65 MM PITCH, PLASTIC, LQFP-100, Static RAM

TC55VD836FF-143 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:QFP包装说明:14 X 20 MM, 1.60 MM HEIGHT, 0.65 MM PITCH, PLASTIC, LQFP-100
针数:100Reach Compliance Code:unknown
风险等级:5.86最长访问时间:4 ns
JESD-30 代码:R-PQFP-G100JESD-609代码:e0
长度:20 mm内存密度:9437184 bit
内存集成电路类型:STANDARD SRAM内存宽度:36
功能数量:1端子数量:100
字数:262144 words字数代码:256000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:256KX36
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):240
认证状态:Not Qualified座面最大高度:1.7 mm
最大供电电压 (Vsup):3.465 V最小供电电压 (Vsup):3.135 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.65 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:14 mm
Base Number Matches:1

TC55VD836FF-143 数据手册

 浏览型号TC55VD836FF-143的Datasheet PDF文件第2页浏览型号TC55VD836FF-143的Datasheet PDF文件第3页浏览型号TC55VD836FF-143的Datasheet PDF文件第4页浏览型号TC55VD836FF-143的Datasheet PDF文件第5页浏览型号TC55VD836FF-143的Datasheet PDF文件第6页浏览型号TC55VD836FF-143的Datasheet PDF文件第7页 
TC55VD836FF-133,-143,-150  
TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS  
262,144-WORD BY 36-BIT SYNCHRONOUS NO-TURNAROUND STATIC RAM  
DESCRIPTION  
The TC55VD836FF is a synchronous static random access memory (SRAM) organized as 262,144 words by 36  
bits. NtRAMTM(no-turnaround SRAM) offers high bandwidth by eliminating dead cycles during the transition from  
a read to a write and vice versa. All inputs except Output Enable OE and the Snooze pin ZZ are synchronized  
with the rising edge of the CLK input. A Read operation is initiated by the ADV Address Advanced Input signal ;  
the input from the address pins and all control pins except the OE and ZZ pins are loaded into the internal  
registers on the rising edge of CLK in the cycle in which ADV is asserted. The output data is available two clock  
cycles later. Write operations are internally self-timed and are initiated by the rising edge of CLK in the cycle in  
which ADV is asserted. The input from the address pins and all control pins except the OE and ZZ pins are loaded  
into the internal registers on the rising edge of CLK in the cycle in which ADV is asserted. Input data is loaded in  
the third cycle after the cycle in which ADV is asserted. Byte Write Enables ( BW1 to BW4 ) allow from one to four  
Byte Write operations to be performed. A 2-bit burst address counter and control logic are integrated into this  
SRAM. The TC55VD836FF uses a single power supply (3.3 V) or dual power supplies (3.3 V for core and 2.5 V for  
output buffer) and is available in a 100-pin low-profile plastic QFP (LQFP).  
FEATURES  
Organized as 262,144 words by 36 bits  
Fast cycle time of 6.6 ns minimum (150 MHz maximum)  
Fast access time of 3.8 ns maximum (from clock edge to data output)  
No-turnaround operation with pipeline data output  
2-bit burst address counter (support for interleaved or linear burst sequences)  
Synchronous self-timed Write  
Byte Write control  
Snooze mode pin (ZZ) for power down  
LVTTL-compatible interface  
Single power supply (3.3 V) or Dual power supplies (3.3 V for core and 2.5 V for output buffer)  
Available in 100-pin LQFP package (LQFP100-P-1420-0.65K ; pitch:0.65 mm, height:1.6 mm, weight:0.56 grams  
(typical))  
PIN ASSIGNMENT (TOP VIEW)  
PIN NAMES  
CLK  
Clock Input  
A0 to A17  
Address Inputs  
99 97 95 93 91 89 87 85 83 81  
100 98 96 94 92 90 88 86 84 82  
I/OP3  
I/O17  
I/O18  
VDDQ  
VSSQ  
I/O19  
I/O20  
I/O21  
I/O22  
VSSQ  
VDDQ  
I/O23  
I/O24  
VDD  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
I/OP2  
I/O16  
I/O15  
VDDQ  
VSSQ  
I/O14  
I/O13  
I/O12  
I/O11  
VSSQ  
VDDQ  
I/O10  
I/O9  
CE , CE2 , CE2 Chip Enable Inputs  
2
3
OE  
Output Enable Input  
Write Enable input  
4
5
WE  
6
7
BW1 to BW4 Byte Write Enable  
8
9
ADV  
CKE  
Address Advance Input  
Clock Enable  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
VSS  
ZZ  
Snooze Input  
VDD  
VDD  
VDD  
VDD  
I/O1 to I/O32  
Data Inputs/Outputs  
VSS  
ZZ  
I/O25  
I/O26  
VDDQ  
VSSQ  
I/O27  
I/O28  
I/O29  
I/O30  
VSSQ  
VDDQ  
I/O31  
I/O32  
I/OP4  
I/O8  
I/OP1 to I/OP4 Parity Data Inputs/Outputs  
I/O7  
VDDQ  
VSSQ  
I/O6  
MODE  
NC  
Mode select Input  
No Connection  
I/O5  
I/O4  
NU  
Not Usable  
I/O3  
VSSQ  
VDDQ  
I/O2  
V
Power Supply for Core  
Power Supply for Output Buffer  
Ground for Core  
DD  
V
I/O1  
DDQ  
32 34 36 38 40 42 44 46 48 50  
31 33 35 37 39 41 43 45 47 49  
I/OP1  
V
SS  
V
Ground for Output Buffer  
SSQ  
TM  
Note : NtRAM  
and No-Turnaround Random Access Memory are  
trademarks of Samsung Electronics Co., Ltd..  
2003-02-20 1/21  

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