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TC55VDM536AFFN15 PDF预览

TC55VDM536AFFN15

更新时间: 2024-09-19 20:37:39
品牌 Logo 应用领域
东芝 - TOSHIBA 静态存储器内存集成电路
页数 文件大小 规格书
22页 503K
描述
IC 1M X 36 ZBT SRAM, 3.8 ns, PQFP100, 14 X 20 MM, 0.65 MM PITCH, PLASTIC, LQFP-100, Static RAM

TC55VDM536AFFN15 技术参数

生命周期:Obsolete零件包装代码:QFP
包装说明:LQFP,针数:100
Reach Compliance Code:unknownECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
最长访问时间:3.8 ns其他特性:PIPELINED ARCHITECTURE
JESD-30 代码:R-PQFP-G100JESD-609代码:e0
长度:20 mm内存密度:37748736 bit
内存集成电路类型:ZBT SRAM内存宽度:36
功能数量:1端子数量:100
字数:1048576 words字数代码:1000000
工作模式:SYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:1MX36
封装主体材料:PLASTIC/EPOXY封装代码:LQFP
封装形状:RECTANGULAR封装形式:FLATPACK, LOW PROFILE
并行/串行:PARALLEL认证状态:Not Qualified
座面最大高度:1.7 mm最大供电电压 (Vsup):3.465 V
最小供电电压 (Vsup):3.135 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:TIN LEAD
端子形式:GULL WING端子节距:0.65 mm
端子位置:QUAD宽度:14 mm
Base Number Matches:1

TC55VDM536AFFN15 数据手册

 浏览型号TC55VDM536AFFN15的Datasheet PDF文件第2页浏览型号TC55VDM536AFFN15的Datasheet PDF文件第3页浏览型号TC55VDM536AFFN15的Datasheet PDF文件第4页浏览型号TC55VDM536AFFN15的Datasheet PDF文件第5页浏览型号TC55VDM536AFFN15的Datasheet PDF文件第6页浏览型号TC55VDM536AFFN15的Datasheet PDF文件第7页 
TC55VDM536AFFN22/20/16/15  
TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS  
36M 3.3V Pipelined NtRAMTM 1M Word by 36Bit  
SYNCHRONOUS NO-TURNAROUND STATIC RAM  
DESCRIPTION  
The TC55VDM536AFFN is a synchronous static random access memory (SRAM) organized as 1,048,576 words  
by 36 bits. NtRAMTM(no-turnaround SRAM) offers high bandwidth by eliminating dead cycles during the  
transition from a read to a write and vice versa. All inputs except Output Enable OE and the Snooze pin ZZ are  
synchronized with the rising edge of the CLK input. A Read operation is initiated by the ADV Address Advanced  
Input signal ; the input from the address pins and all control pins except the OE and ZZ pins are loaded into the  
internal registers on the rising edge of CLK in the cycle in which ADV is asserted. The output data is available two  
clock cycles later. Write operations are internally self-timed and are initiated by the rising edge of CLK in the cycle  
in which ADV is asserted. The input from the address pins and all control pins except the OE and ZZ pins are  
loaded into the internal registers on the rising edge of CLK in the cycle in which ADV is asserted. Input data is  
loaded in the third cycle after the cycle in which ADV is asserted. Byte Write Enables ( BW1 to BW4 ) allow from  
one to four Byte Write operations to be performed. A 2-bit burst address counter and control logic are integrated  
into this SRAM. The TC55VDM536AFFN uses a single power supply (3.3 V) or dual power supplies (3.3 V for core  
and 2.5 V for output buffer) and is available in a 100-pin low-profile plastic QFP (LQFP).  
FEATURES  
Organized as 1,048,576 words by 36 bits  
No-turnaround operation with pipeline data output  
2-bit burst address counter  
Single 3.3V 5% power supply VDD  
Dual 3.3 V or 2.5 V power supply VDDQ  
Available in 100-pin LQFP package  
(support for interleaved or linear burst sequences)  
Synchronous self-timed Write  
(LQFP100-P-1420-0.65B ; weight :  
grams  
(typical))  
Byte Write control  
MHz  
ns  
225  
4.4  
2.8  
200  
167  
6.0  
3.5  
150  
6.6  
3.8  
Snooze mode pin (ZZ) for power down  
LVTTL-compatible interface  
Clock Cycle Time  
Clock Access Time  
Operating Current IDDO1  
tKC  
tKQV  
5.0  
3.2  
ns  
TBD  
mA  
PIN ASSIGNMENT (TOP VIEW)  
PIN NAMES  
CLK  
Clock Input  
Address Inputs  
A0 to A19  
99 97 95 93 91 89 87 85 83 81  
100 98 96 94 92 90 88 86 84 82  
I/OP3  
I/O17  
I/O18  
VDDQ  
VSSQ  
I/O19  
I/O20  
I/O21  
I/O22  
VSSQ  
VDDQ  
I/O23  
I/O24  
VDD  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
I/OP2  
I/O16  
I/O15  
VDDQ  
VSSQ  
I/O14  
I/O13  
I/O12  
I/O11  
VSSQ  
VDDQ  
I/O10  
I/O9  
CE , CE2 , CE2 Chip Enable Inputs  
2
3
OE  
Output Enable Input  
Write Enable input  
4
5
WE  
6
7
BW1 to BW4 Byte Write Enable  
8
9
ADV  
CKE  
Address Advance Input  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
Clock Enable  
VSS  
ZZ  
Snooze Input  
VDD  
VDD  
VDD  
VSS  
VDD  
I/O1 to I/O32  
Data Inputs/Outputs  
ZZ  
I/O25  
I/O26  
VDDQ  
VSSQ  
I/O27  
I/O28  
I/O29  
I/O30  
VSSQ  
VDDQ  
I/O31  
I/O32  
I/OP4  
I/O8  
I/OP1 to I/OP4 Parity Data Inputs/Outputs  
I/O7  
VDDQ  
VSSQ  
I/O6  
MODE  
NC  
Mode select Input  
No Connection  
I/O5  
I/O4  
NU  
Not Usable  
I/O3  
VSSQ  
VDDQ  
I/O2  
V
Power Supply for Core  
Power Supply for Output Buffer  
Ground for Core  
DD  
V
V
I/O1  
DDQ  
32 34 36 38 40 42 44 46 48 50  
31 33 35 37 39 41 43 45 47 49  
I/OP1  
V
SS  
Ground for Output Buffer  
SSQ  
TM  
Note :  
NtRAM  
and No-Turnaround Random Access  
Memory are trademarks of Samsung Electronics Co., Ltd..  
2003-01-08 1/22  

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