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SZESD7551 PDF预览

SZESD7551

更新时间: 2024-01-26 15:13:20
品牌 Logo 应用领域
安森美 - ONSEMI /
页数 文件大小 规格书
5页 71K
描述
ESD Protection Diodes

SZESD7551 数据手册

 浏览型号SZESD7551的Datasheet PDF文件第2页浏览型号SZESD7551的Datasheet PDF文件第3页浏览型号SZESD7551的Datasheet PDF文件第4页浏览型号SZESD7551的Datasheet PDF文件第5页 
ESD7551, SZESD7551  
ESD Protection Diodes  
Micro−Packaged Diodes for ESD Protection  
The ESD7551 is designed to protect voltage sensitive components  
that require ultra−low capacitance from ESD and transient voltage  
events. Excellent clamping capability, low capacitance, low leakage,  
and fast response time, make these parts ideal for ESD protection on  
designs where board space is at a premium. Because of its low  
capacitance, the part is well suited for use in high frequency designs  
such as USB 2.0 high speed and antenna line applications.  
www.onsemi.com  
1
2
Cathode  
Anode  
Features  
Ultra−Low Capacitance (0.35 pF Max)  
Low Clamping Voltage  
Stand−off Voltage: 3.3 V  
Low Leakage  
MARKING  
DIAGRAM  
X2DFN2  
CASE 714AB  
E M  
G
Response Time is < 1 ns  
Low Dynamic Resistance < 1 W  
Protection for the Following Standards:  
E
M
= Specific Device Code  
= Date Code  
IEC 61000−4−2 (Level 4) & ISO 10605  
SZ Prefix for Automotive and Other Applications Requiring Unique  
Site and Control Change Requirements; AEC−Q101 Qualified and  
PPAP Capable  
ORDERING INFORMATION  
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS  
Device  
Package  
Shipping  
Compliant  
ESD7551N2T5G  
X2DFN2  
(Pb−Free)  
8000 / Tape &  
Reel  
Typical Applications  
RF Signal ESD Protection  
SZESD7551N2T5G X2DFN2  
(Pb−Free)  
8000 / Tape &  
Reel  
RF Switching, PA, and Antenna ESD Protection  
Near Field Communications  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specifications  
Brochure, BRD8011/D.  
MAXIMUM RATINGS  
Rating  
Symbol  
Value  
Unit  
Total Power Dissipation on FR−5 Board  
°P °  
250  
mW  
D
(Note 1) @ T = 25°C  
A
Thermal Resistance, Junction−to−Ambient  
R
400  
−55 to +150  
260  
°C/W  
°C  
q
JA  
Junction and Storage Temperature Range T , T  
J
stg  
Lead Solder Temperature − Maximum  
(10 Second Duration)  
T
L
°C  
IEC 61000−4−2 Contact  
IEC 61000−4−2 Air  
ISO 10605 150 pF/2 kW  
ISO 10605 330 pF/2 kW  
ISO 10605 330 pF/330 W  
ESD  
25  
25  
30  
30  
20  
kV  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. FR−5 = 1.0 x 0.75 x 0.62 in.  
See Application Note AND8308/D for further description of survivability specs.  
© Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
November, 2016 − Rev. 0  
ESD7551/D  
 

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