Datasheet > SZESD8008MUTAG

SZESD8008MUTAG

更新时间： 2023-06-19 14:31:45

品牌	Logo	应用领域
安森美 - ONSEMI		/
页数	文件大小	规格书
9页	198K
描述
ESD 保护阵列，一对一 HS

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中文翻译

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数据手册

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SZESD8008MUTAG 数据手册

ESD8008

ESD Protection Diode

Low Capacitance Array for High Speed

Data Lines

The ESD8008 is designed specifically to protect four high speed

differential pairs. Ultra−low capacitance and low ESD clamping

voltage make this device an ideal solution for protecting voltage

sensitive high speed data lines. The flow−through style package

allows for easy PCB layout and matched trace lengths necessary to

maintain consistent impedance for the high speed lines.

www.onsemi.com

MARKING

DIAGRAM

8008M

UDFN14

CASE 517CN

Features

• Integrated 4 Pairs (8 Lines) High Speed Data

• Single Connect, Flow through Routing

• Low Capacitance (0.35 pF Max, I/O to GND)

8008

= Specific Device Code

= Date Code

= Pb−Free Package

• Protection for the Following IEC Standards:

IEC 61000−4−2 Level 4 (ESD) 15 kV (Contact)

IEC 61000−4−5 (Lightning) 5 A (8/20 ms)

• UL Flammability Rating of 94 V−0

ORDERING INFORMATION

• SZ Prefix for Automotive and Other Applications Requiring Unique

Site and Control Change Requirements; AEC−Q101 Qualified and

PPAP Capable

Device

ESD8008MUTAG

Package

Shipping

UDFN14

(Pb−Free)

3000 / Tape &

Reel

• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS

Compliant

SZESD8008MUTAG UDFN14

3000 / Tape &

Reel

(Pb−Free)

Typical Applications

• V−by−One HS

• LVDS

†For information on tape and reel specifications,

including part orientation and tape sizes, please

refer to our Tape and Reel Packaging Specification

Brochure, BRD8011/D.

• Display Port

MAXIMUM RATINGS (T = 25°C unless otherwise noted)

Rating

Symbol

Value

−55 to +125

−55 to +150

260

Unit

°C

Operating Junction Temperature Range

Storage Temperature Range

stg

°C

Lead Solder Temperature −

Maximum (10 Seconds)

°C

IEC 61000−4−2 Contact (ESD)

IEC 61000−4−2 Air (ESD)

ESD

Maximum Peak Pulse Current

5.0

8/20 ms @ T = 25°C (I/O−GND)

Stresses exceeding those listed in the Maximum Ratings table may damage the

device. If any of these limits are exceeded, device functionality should not be

assumed, damage may occur and reliability may be affected.

See Application Note AND8308/D for further description of

survivability specs.

Publication Order Number:

February, 2015 − Rev. 4

ESD8008/D

12 3 4 5 6 7...9

中文翻译

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