SN74AUC2G125
DUAL BUS BUFFER GATE
WITH 3-STATE OUTPUTS
www.ti.com
SCES532D–DECEMBER 2003–REVISED AUGUST 2007
FEATURES
•
Available in the Texas Instruments
NanoFree™ Package
•
•
•
Low Power Consumption, 10 μA at 1.8 V
±8-mA Output Drive at 1.8 V
•
Optimized for 1.8-V Operation and Is 3.6-V I/O
Tolerant to Support Mixed-Mode Signal
Operation
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
•
ESD Protection Exceeds JESD 22
•
Ioff Supports Partial-Power-Down Mode
Operation
–
–
–
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
•
•
Sub-1-V Operable
1000-V Charged-Device Model (C101)
Max tpd of 1.8 ns at 1.8 V
DCT PACKAGE
(TOP VIEW)
DCU PACKAGE
(TOP VIEW)
YZP PACKAGE
(BOTTOM VIEW)
2A
4 5
GND
VCC
1OE
1
2
3
4
8
7
6
5
VCC
1OE
1A
1
2
8
7
3 6
1Y
2Y
1A
1A
2Y
2OE
1Y
2
7
2OE
VCC
2OE
1 8
1OE
GND
2A
3
4
6
5
2Y
1Y
2A
GND
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This dual bus buffer gate is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V
VCC operation.
The SN74AUC2G125 features dual line drivers with 3-state outputs. The outputs are disabled when the
associated output-enable (OE) input is high.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION
TA
PACKAGE(1)(2)
ORDERABLE PART NUMBER
TOP-SIDE MARKING(3)
NanoFree™ – WCSP (DSBGA)
0.23-mm Large Bump – YZP (Pb-free)
Reel of 3000
SN74AUC2G125YZPR
_ _ _UM_
–40°C to 85°C
SSOP – DCT
Reel of 3000
Reel of 3000
SN74AUC2G125DCTR
SN74AUC2G125DCUR
U25_ _ _
U25_
VSSOP – DCU
(1) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
(2) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(3) DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, • = Pb-free).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.