NUP4304MR6
Low Capacitance Diode
Array for ESD Protection in
Four Data Lines
NUP4304MR6 is a MicroIntegration™ device designed to provide
protection for sensitive components from possible harmful electrical
transients; for example, ESD (electrostatic discharge).
Features
http://onsemi.com
PIN CONFIGURATION
AND SCHEMATIC
• Low Capacitance (1.5 pF Maximum Between I/O Lines)
• Single Package Integration Design
• Provides ESD Protection for JEDEC Standards JESD22
I/O 1
6 I/O
5 V
Machine Model = Class C
Human Body Model = Class 3B
• Protection for IEC61000−4−2 (Level 4)
8.0 kV (Contact)
V
P
2
N
4 I/O
1/O 3
15 kV (Air)
• Ensures Data Line Speed and Integrity
• Fewer Components and Less Board Space
MARKING DIAGRAM
• Direct the Transient to Either Positive Side or to the Ground
4
5
Applications
6
• USB 1.1 and 2.0 Data Line Protection
3
LG MG
2
1
• T1/E1 Secondary IC Protection
• T3/E3 Secondary IC Protection
• HDSL, IDSL Secondary IC Protection
• Video Line Protection
G
TSOP−6
CASE 318F
PLASTIC
LG
M
G
= Specific Device Code
= Date Code
= Pb−Free Package
• Microcontroller Input Protection
• Base Stations
(Note: Microdot may be in either location)
2
• I C Bus Protection
• Pb−Free Package is Available
ORDERING INFORMATION
MAXIMUM RATINGS (Each Diode) (T = 25°C unless otherwise noted)
J
Device
Package
Shipping†
Rating
Reverse Voltage
Symbol
Value
70
Unit
Vdc
mAdc
mAdc
V
V
R
NUP4304MR6T1
TSOP−6 3000/Tape & Reel
Forward Current
I
F
200
500
70
NUP4304MR6T1G TSOP−6 3000/Tape & Reel
(Pb−Free)
Peak Forward Surge Current
Repetitive Peak Reverse Voltage
I
FM(surge)
V
RRM
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Average Rectified Forward
Current (Note 1)
(averaged over any 20 ms period)
I
715
mA
F(AV)
Repetitive Peak Forward Current
I
450
mA
A
FRM
Non−Repetitive Peak Forward Current
I
FSM
t = 1.0 ms
t = 1.0 ms
t = 1.0 S
2.0
1.0
0.5
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. FR−5 = 1.0 ꢀ 0.75 ꢀ 0.062 in.
© Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
January, 2006 − Rev. 1
NUP4304MR6/D