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NSVR05F40NXT5G PDF预览

NSVR05F40NXT5G

更新时间: 2023-06-19 14:31:36
品牌 Logo 应用领域
安森美 - ONSEMI 整流二极管
页数 文件大小 规格书
4页 88K
描述
肖特基势垒二极管,500 mA,40 V

NSVR05F40NXT5G 数据手册

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NSR05F40NXT5G  
Schottky Barrier Diode  
These Schottky barrier diodes are optimized for low forward  
voltage drop and low leakage current and are offered in a Chip Scale  
Package (CSP) to reduce board space. The low thermal resistance  
enables designers to meet the challenging task of achieving higher  
efficiency and meeting reduced space requirements.  
http://onsemi.com  
Features  
40 V SCHOTTKY  
BARRIER DIODE  
Low Forward Voltage Drop 420 mV @ 500 mA  
Low Reverse Current 15 mA @ 10 V VR  
500 mA of Continuous Forward Current  
ESD Rating Human Body Model: Class 3B  
ESD Rating Machine Model: Class C  
High Switching Speed  
1
2
CATHODE  
ANODE  
These Devices are PbFree, Halogen Free/BFR Free and are RoHS  
Compliant  
2
MARKING  
DIAGRAM  
Typical Applications  
PIN 1  
1
LCD and Keypad Backlighting  
Camera Photo Flash  
Buck and Boost dcdc Converters  
Reverse Voltage and Current Protection  
Clamping and Protection  
DSN2  
(0402)  
05F40  
YYY  
CASE 152AC  
05F40 = Specific Device Code  
YYY = Year Code  
Markets  
Mobile Handsets  
MP3 Players  
Digital Camera and Camcorders  
Notebook PCs & PDAs  
GPS  
ORDERING INFORMATION  
Device  
NSR05F40NXT5G  
Package  
Shipping†  
5000 / Tape & Reel  
DSN2  
(PbFree)  
†For information on tape and reel specifications,  
including part orientation and tape sizes, please  
refer to our Tape and Reel Packaging Specifications  
Brochure, BRD8011/D.  
MAXIMUM RATINGS  
Rating  
Symbol  
Value  
40  
Unit  
V
Reverse Voltage  
V
R
Forward Current (DC)  
Forward Surge Current  
I
500  
mA  
A
F
I
FSM  
(60 Hz @ 1 cycle)  
10  
ESD Rating:  
Human Body Model  
Machine Model  
ESD  
> 8  
> 400  
kV  
V
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
© Semiconductor Components Industries, LLC, 2010  
1
Publication Order Number:  
July, 2010 Rev. 2  
NSR05F40/D  

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