Datasheet > NSVR0620P2T5G

NSVR0620P2T5G

更新时间： 2023-06-19 14:31:36

品牌	Logo	应用领域
安森美 - ONSEMI		/
页数	文件大小	规格书
4页	107K
描述
500 mA, 20 V, Schottky Barrier Diode

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NSVR0620P2T5G 数据手册

NSR0620P2T5G

Schottky Barrier Diode

Schottky barrier diodes are optimized for very low forward voltage

drop and low leakage current and are used in a wide range of dc−dc

converter, clamping and protection applications in portable devices.

NSR0620P2 in a SOD−923 miniature package enables designers to

meet the challenging task of achieving higher efficiency and meeting

reduced space requirements.

http://onsemi.com

Features

20 V SCHOTTKY

BARRIER DIODE

• Very Low Forward Voltage Drop − 350 mV @ 100 mA

• Low Reverse Current − 2.0 mA @ 10 V

• Continuous Forward Current − 500 mA

• Power Dissipation with Minimum Trace − 190 mW

• Very High Switching Speed − 4.0 ns @ 10 mA

• Low Capacitance − 12 pF @ 1.0 V

• This is a Pb−Free Device

CATHODE

ANODE

MARKING

DIAGRAM

Typical Applications

• LCD and Keypad Backlighting

• Camera Photo Flash

• Buck and Boost dc−dc Converters

• Reverse Voltage and Current Protection

• Clamping & Protection

SOD−923

CASE 514AB

PLASTIC

= Specific Device Code

= Month Code

= Pb−Free Package

Markets

• Mobile Handsets

• MP3 Players

(Note: Microdot may be in either location)

• Digital Camera and Camcorders

• Notebook PCs & PDAs

• GPS

ORDERING INFORMATION

Device

Package

Shipping†

MAXIMUM RATINGS

NSR0620P2T5G SOD−923

2 mm Pitch

(Pb−Free) 8000/Tape & Reel

Rating

Symbol

Value

Unit

Vdc

Reverse Voltage

†For information on tape and reel specifications,

including part orientation and tape sizes, please

refer to our Tape and Reel Packaging Specifications

Brochure, BRD8011/D.

Forward Continuous Current (DC)

500

Non−Repetitive Peak Forward Surge

1.0

FSM

Current

ESD Rating: Human Body Model

Machine Model

ESD

Class 3B

Class C

Stresses exceeding Maximum Ratings may damage the device. Maximum

Ratings are stress ratings only. Functional operation above the Recommended

Operating Conditions is not implied. Extended exposure to stresses above the

Recommended Operating Conditions may affect device reliability.

Semiconductor Components Industries, LLC, 2008

Publication Order Number:

July, 2008 − Rev. 0

NSR0620P2/D

12 3 4

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