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MT3S22P(TE12L,F) PDF预览

MT3S22P(TE12L,F)

更新时间: 2024-11-05 21:20:27
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
5页 189K
描述
TRANSISTOR,BJT,NPN,6V V(BR)CEO,80MA I(C),SC-62

MT3S22P(TE12L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.61最大集电极电流 (IC):0.08 A
配置:Single最小直流电流增益 (hFE):100
最高工作温度:150 °C极性/信道类型:NPN
最大功率耗散 (Abs):1.8 W子类别:Other Transistors
表面贴装:YES标称过渡频率 (fT):6500 MHz
Base Number Matches:1

MT3S22P(TE12L,F) 数据手册

 浏览型号MT3S22P(TE12L,F)的Datasheet PDF文件第2页浏览型号MT3S22P(TE12L,F)的Datasheet PDF文件第3页浏览型号MT3S22P(TE12L,F)的Datasheet PDF文件第4页浏览型号MT3S22P(TE12L,F)的Datasheet PDF文件第5页 
MT3S22P  
TOSHIBA Transistor Silicon NPN Epitaxial Planar Type  
MT3S22P  
VHF-UHF Band Low-Noise, Low-Distortion Amplifier Applications  
Unit: mm  
FEATURES  
Low Noise Figure: NF=1.5dB(Typ.) (@f=1GHz)  
High Gain: |S21e|2=10.5dB(Typ.) (@f=1GHz)  
Marking  
T 5  
PW-Mini  
JEDEC  
JEITA  
-
SC-62  
2-5K1A  
TOSHIBA  
Absolute Maximum Ratings (Ta = 25°C)  
Weight: 0.05 g (Typ.)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
12  
V
V
Collector-emitter voltage  
Emitter-base voltage  
Collector-current  
6
2
80  
V
I
mA  
mA  
mW  
W
C
Base-current  
I
10  
B
Collector power dissipation  
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
400  
C
P (Note1)  
C
1.8  
T
j
150  
°C  
°C  
T
stg  
55 to 150  
Note.1: The device is mounted on a ceramic board (25mm × 25mm × 0.8 mm (t))  
Note.2 : Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if  
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-12-10  

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